Apparatus and methods for time domain reflectometry

ABSTRACT

Time Domain Reflectometry (&#34;TDR&#34;) methods and apparatus for measuring propagation velocities of RF pulses to determine material liquid contents, moisture profiles, material levels and dielectric constants including: i) TDR probes and/or probe adaptors, including series averaging probes and multi-segment probes, all employing remotely operable, normally open, variable impedance devices such as diodes; ii) bias insertion and switching networks for rendering selected normally open variable impedance devices conductive one at a time to establish precise unambiguous timing markers T 1  . . . T n  ; iii) an RF cable coupling the probe to a TDR instrument; and, iv) a TDR instrument having: a) a variable impedance device Control Section including a Divide-By-2 circuit and a Diode Drive circuit; b) an RF section containing a Pulse Generator, a Sample-And-Hold circuit, and a Variable Delay circuit; c) a Synchronous Detection Section including a Repetition Rate Generator; filter, AC amplifiers, Analog Multiplier and Low Pass Filter connected in series and receiving sampled signals; d) a Delay circuit and AC amplifier for transmitting a Synchronous Detector Reference signal to the Multiplier; and e), capability for conditioning the TDR instrument to operate in a remotely shortable diode ON/OFF modulation mode or a Time Delay modulation mode. Repetitively sampled reflections are processed through a Synchronous Detection System to convert square wave signals generated by the Sample-And-Hold circuit into DC output signals V(T) representative of the difference function between reflections under shorted and open conditions and/or of the slope of the diode open reflection.

The present application is a division of applicant's U.S. applicationSer. No. 08/071,748, filed Jun. 9, 1993, now U.S. Pat. No. 5,376,888,entitled "APPARATUS AND METHODS FOR GENERATING UNAMBIGUOUS LARGEAMPLITUDE TIMING MARKERS IN TIME DOMAIN REFLECTOMETRY SYSTEMS FORMEASURING PROPAGATION VELOCITIES OF RF PULSES TO DETERMINE MATERIALLIQUID CONTENTS, MOISTURE PROFILES IN SOIL AND SIMILAR TEST MATERIALS,MATERIAL LEVELS, AND MATERIAL DIELECTRIC CONSTANTS".

BACKGROUND OF THE INVENTION

1. Technical Field

The present invention relates generally to Time Domain ReflectometrySystems (hereinafter "TDR") used to measure the propagation velocity ofRF pulses along transmission lines, or probes, inserted into materialundergoing test for water or other liquid content, or to determinematerial levels in a container, or to determine material dielectricconstants; and, more particularly, to improved transmission line probesand/or probe adapters employing at least one and, preferably two ormore, remotely operated, active, normally open, variable impedancedevices for establishing one or more unambiguous large amplitude timingmarkers that are readily discernable and measurable by both observationand manual techniques, as well as by automated electronic processing,measuring and display systems.

More specifically, and in one preferred embodiment, the presentinvention--an invention which finds particularly advantageous, but by nomeans exclusive, use in the fields of soil science, hydrology,agriculture, seedling nurseries and similar soil/moistureenvironments--relates to methods and apparatus including active, ascontrasted with passive, variable impedance devices such, merely by wayof example, as at least one, and preferably n pairs (where "n" is anydesired whole integer) of PIN diodes interconnecting the paralleltransmission lines defining a moisture sensitive probe at selected,known, spaced points X₁, X₂ . . . X_(n), along the probe. As aconsequence of this arrangement, when any given variable impedancedevice or diode is biased to the conductive state, the resultingelectrical short produces an electrical discontinuity which serves totransmit a large amplitude reflection to the TDR instrument establishingan unambiguous, large amplitude, readily discernable and measurabletiming marker T_(n) ; yet, when the variable impedance device or diodeis biased to the nonconductive or open state, the electromagnetic pulsesare propagated down the transmission line without change except forattenuation inherently resulting from the natural impedancecharacteristics of the transmission line.

Stated differently, the remotely operated, active, variable impedancedevices mounted on the probe, when biased to conduction to establish ashorted electrical discontinuity in the transmission line, serve togreatly increase the amplitude, and therefore the detectability andmeasurability, of the T₁, T₂ . . . T_(n) reflections respectivelyproduced at the X₁, X₂ . . . X_(n) specific points along the probe wherethe variable impedance devices are located.

The invention finds particularly advantageous use when employed withdifferential detection apparatus and methods, including waveformsubtraction techniques, so as to provide a significant increase in theeffective amplitude of the reflections of interest, as well assignificant reduction and/or elimination of background noise resultingfrom, for example, mismatched and inexpensive electrical components andother spurious discontinuities, such, merely by way of example, asspurious reflections from layer interfaces in layered soil.

Probes employing variable impedance devices may be interrogated, anddifferential detection techniques may be employed using a conventionalTDR instrument; or, in another of its important aspects, the inventionpermits use of synchronous detection techniques for processing signalsat one or more precise timing markers T₁, T₂ . . . T_(n) where suchsignals are representative of probe reflections derived from shortablediodes, or similar shortable variable impedance devices, to provideremotely shortable diode ON/OFF modulation.

In another embodiment, this invention allows the optional processing ofreflections in those instances where the probes do not have remotelyshortable impedance device capability, or where the probes employ only asingle remotely shortable impedance device. The present inventionpermits of time delay modulation by rapidly switching between two presetdelay circuits so as to establish first and second preset time delaysT_(A), T_(B) and to generate a square wave output signal from aSample-And-Hold circuit whose amplitude is proportional to the slope ofthe reflection, which signal is then processed using synchronousdetection techniques. Such an arrangement is particularly advantageouswhen dealing with relatively homogeneous soils of the type found inseedling nurseries where the natural reflection at the end of thetransmission line/probe at time T₂ is typically large and free fromdistortion.

As the ensuing description proceeds, the invention will be described inconnection with a TDR system for detecting and measuring soil watercontent and providing moisture profiles of the soil medium under testsince the invention finds particularly advantageous application in thisparticular agricultural field and in the related fields of soil scienceand hydrology. However, those skilled in the art will appreciate as theensuing description proceeds that the invention is not limited tomeasurement of soil water content and/or generating moisture profiles;but, rather, it will also find advantageous application in environmentswherein the medium under test may comprise, for example, granular and/orparticulate materials other than soil, sand or the like--for example,grain--and where the liquid whose volume content is of interest is otherthan water--for example, alcohol or the like. Moreover, it will beunderstood by those skilled in the art that the invention can also beused to determine levels of liquids or dry particulate solids in storagecontainers, or to determine the dielectric constant K of any solidmaterial through which the probe extends. Therefore, it will beunderstood that terms such as "soil", "water" and "moisture" are usedherein and in the appended claims in a non-limiting sense and fordescriptive purposes only.

2. Background Art

Those skilled in the art will, of course, appreciate that TDR apparatusand methods have been widely used for many years in a wide range ofdifferent applications including, but not limited to, the measurement ofsoil water content and similar material liquid content. Such systems arebased upon the principle that since the dielectric constant K of wateris approximately 80--e.g., 78.9 at 23° C.--while the dielectricconstants for various materials are known and considerably lower--forexample, the dielectric constant for most dry soil solids ranges fromabout 2 to about 5--a measurement of the dielectric constant of a soilor other material sample provides an excellent measure of the soil's orother material's water content or other dielectric characteristic. And,since it is also known that the apparent dielectric constant K_(a) of amoist soil sample or other moist material sample is directly related tothe propagation velocity V of an electromagnetic wave as it transits anRF transmission line extending through the particular sample undergoingtest, TDR systems have been designed to provide fast rise timeelectromagnetic pulses which are propagated along a transmission line ofknown length while measuring the times of arrival T₁, T₂ of reflectionsfrom electrical discontinuities in the transmission line at two knownspaced points X₁, X₂ --for example, where X₁ represents the air/materialinterface where the coaxial connecting cable is attached to thetransmission line probe and X₂ represents the distal end of thetransmission line probe, thereby enabling calculation of the propagationvelocity V of the electromagnetic wave and, therefore, calculation ofthe apparent dielectric constant K_(a) of the material undergoing testand through which the transmission line probe extends. Such calculatedapparent dielectric constant K_(a) may be of interest, or it may providea direct indication of the test material's water (or other liquid)content.

The foregoing general principles of TDR systems are, as stated above,well known and have been described in considerable detail in theliterature. Those interested in a comprehensive, but far fromexhaustive, compilation of said literature references are referred tothe following articles:

    ______________________________________                                        Ref. No. 1                                                                             Alharthi, A. and Lange, J., Soil                                              Water Saturation: Dielectric                                                  Determination, WATER RESOURCES                                                RESEARCH, Vol. 23, No. 4, pp. 591-595                                         (April, 1987).                                                       Ref. No. 2                                                                             Anon., Circuit Description, TEKTRONIX                                         1502 TDR INSTRUMENT OPERATORS AND                                             MAINTENANCE MANUAL, Sect. 3, pp. 3-1-                                         3-6 and PULSER/SAMPLER DRG. (rev.)                                            (January, 1986).                                                     Ref. No. 3                                                                             Baker, J. M. and Allmaras, R. R.,                                             System for Automating and                                                     Multiplexing Soil Moisture                                                    Measurement by Time-Domain                                                    Reflectometry, SOIL SCIENCE SOCIETY                                           OF AMERICA JOURNAL, Vol. 54, No. 1,                                           pp. 1-6 (January-February, 1990).                                    Ref. No. 4                                                                             Baker, J. M. and Lascano, R. J., The                                          Spatial Sensitivity of Time-Domain                                            Reflectometry, SOIL SCIENCE, Vol.                                             147, No. 5, pp. 378-384 (May, 1989).                                 Ref. No. 5                                                                             Dalton, F. N., Herkelrath, W. N.,                                             Rawlins, D. S. and Rhoades, J. D.,                                            Time-Domain Reflectometry:                                                    Simultaneous Measurement of Soil                                              Water Content and Electrical                                                  Conductivity with a Single Probe,                                             SCIENCE, Vol. 224, pp. 989-990                                                (1984).                                                              Ref. No. 6                                                                             Dalton, F. N. and van Genuchten,                                              M. Th., The Time-Domain Reflectometry                                         Method For Measuring Soil Water                                               Content And Salinity, GEODERMA, Vol.                                          38, pp. 237-250 (1986).                                              Ref. No. 7                                                                             Dasberg, S. and Dalton, F. N., Time                                           Domain Reflectometry Field                                                    Measurements of Soil Water Content                                            and Electrical Conductivity, SOIL                                             SCIENCE SOCIETY OF AMERICA, Vol. 49,                                          pp. 293-297 (1985).                                                  Ref. No. 8                                                                             Dasberg, S. and Hopmans, J. W., Time                                          Domain Reflectometry Calibration for                                          Uniformly and Nonuniformly Wetted                                             Sandy and Clayey Loam Soils, SOIL                                             SCIENCE SOCIETY OF AMERICA JOURNAL,                                           Vol. 56, pp. 1341-1345 (1992).                                       Ref. No. 9                                                                             Fellner-Feldegg, H., The Measurement                                          of Dielectrics in the Time Domain,                                            THE JOURNAL OF PHYSICAL CHEMISTRY,                                            Vol. 73, No. 3, pp. 616-623 (March,                                           1969).                                                               Ref. No. 10                                                                            Grove, W. M., Sampling for                                                    Oscilloscopes and Other RF Systems:                                           Dc Through X-Band, ISEE, TRANSACTIONS                                         ON MICROWAVE THEORY AND TECHNIQUES,                                           Vol. MTT-14, No. 12 (December, 1966).                                Ref. No. 11                                                                            Heimovaara, T. J. and Bouten, W., A                                           Computer-Controlled 36-Channel Time                                           Domain Reflectometry System for                                               Monitoring Soil Water Contents, WATER                                         RESOURCES RESEARCH, Vol. 26, No. 10,                                          pp. 2311-2316 (October, 1990).                                       Ref. No. 12                                                                            Hook, W. R., Livingston, N. J., Sun,                                          Z. J. and Hook, P. B., Remote Diode                                           Shorting Improves Measurement of Soil                                         Water by Time Domain Reflectometry,                                           SOIL SCIENCE SOCIETY OF AMERICA                                               JOURNAL, Vol. 56, pp. 1384-1391                                               (September-October, 1992).                                           Ref. No. 13                                                                            Kachanoski, R. G., Pringle, E. and                                            Ward, A., Field Measurement of Solute                                         Travel Times Using Time Domain                                                Reflectometry, SOIL SCIENCE SOCIETY                                           OF AMERICA JOURNAL, Vol. 56, pp. 47-                                          52 (1992).                                                           Ref. No. 14                                                                            Ledieu, J., de Ridder, P., de Clerck,                                         P. and Dautrebande, S., A Method of                                           Measuring Soil Moisture By Time-                                              Domain Reflectometry, JOURNAL OF                                              HYDROLOGY, Vol. 88, pp. 319-328                                               (1986).                                                              Ref. No. 15                                                                            Malicki, M. A. and Skierucha, W. M., A                                        Manually Controlled TDR Soil Moisture                                         Meter Operating With 300 ps Rise-Time                                         Needle Pulse, PROCEEDINGS OF                                                  INTERNATIONAL CONFERENCE ON                                                   MEASUREMENT OF SOIL AND PLANT WATER                                           STATUS, Vol. 1-Soils, pp. 103-109,                                            Academic Press, Inc. (1987).                                         Ref. No. 16                                                                            Nadler, A., Dasberg, S. and Lapid,                                            I., Time Domain Reflectometry                                                 Measurements of Water Content and                                             Electrical Conductivity of Layered                                            Soil Columns, SOIL SCIENCE SOCIETY OF                                         AMERICA JOURNAL, Vol. 55, pp. 938-943                                         (July-August, 1991).                                                 Ref. No. 17                                                                            Rhoades, J. D., Raats, P. A. C. and                                           Prather, R. J., Effects of Liquid-                                            phase Electrical Conductivity, Water                                          Content, and Surface Conductivity on                                          Bulk Soil Electrical Conductivity,                                            SOIL SCIENCE SOCIETY OF AMERICA                                               JOURNAL, Vol. 40, pp. 651-655 (1976).                                Ref. No. 18                                                                            Rhoades, J. D. and van Schilfgaarde,                                          J., An Electrical Conductivity Probe                                          for Determining Soil Salinity, SOIL                                           SCIENCE SOCIETY OF AMERICA JOURNAL,                                           Vol. 40, pp. 647-651 (1976).                                         Ref. No. 19                                                                            Roth, K., Schulin, R., Fluhler, H.                                            and Attinger, W., Calibration of Time                                         Domain Reflectometry for Water                                                Content Measurement Using a Composite                                         Dielectric Approach, WATER RESOURCES                                          RESEARCH, Vol. 26, No. 10, pp. 2267-                                          2273 (October, 1990).                                                Ref. No. 20                                                                            Topp, G. C., The Application Of Time-                                         Domain Reflectometry (TDR) To Soil                                            Water Content Measurement,                                                    PROCEEDINGS OF INTERNATIONAL                                                  CONFERENCE ON MEASUREMENT OF SOIL AND                                         PLANT WATER STATUS, Vol. 1-Soils, pp.                                         85-93, Academic Press, Inc. (1987).                                  Ref. No. 21                                                                            Topp, G. C., Davis, J. L. and Annan,                                          A. P., Electromagnetic Determination                                          of Soil Water Content: Measurements                                           in Coaxial Transmission Lines, WATER                                          RESOURCES RESEARCH, Vol. 16, No. 3,                                           pp. 574-582 (June, 1980).                                            Ref. No. 22                                                                            Topp, G. C., Davis, J. L. and Annan,                                          A. P., Electromagnetic Determination                                          of Soil Water Content Using TDR:II.                                           Evaluation of Installation and                                                Configuration of Parallel                                                     Transmission Lines, SOIL SCIENCE                                              SOCIETY OF AMERICA JOURNAL, Vol. 46,                                          pp. 672-678 (1982).                                                  Ref. No. 23                                                                            Topp, G. C. and Davis, J. L., Time-                                           Domain Reflectometry (TDR) And Its                                            Application To Irrigation Scheduling,                                         ADVANCES IN IRRIGATION, Vol. 3, pp.                                           107-127, Academic Press, Inc. (1985).                                Ref. No. 24                                                                            Topp, G. C. and Davis, J. L.,                                                 Measurement of Soil Water Content                                             using Time-domain Reflectrometry                                              (TDR): A Field Evaluation, SOIL                                               SCIENCE SOCIETY OF AMERICA JOURNAL,                                           Vol. 49, pp. 19-24 (1985).                                           Ref. No. 25                                                                            Topp, G. C., Yanuka, M., Zebchuk, W. D.                                       and Zegelin, S., Determination of                                             Electrical Conductivity Using Time                                            Domain Reflectometry: Soil and Water                                          Experiments in Coaxial Lines, WATER                                           RESOURCES RESEARCH, Vol. 24, No. 7,                                           pp. 945-952 (July, 1988).                                            Ref. No. 26                                                                            Wraith, J. M. and Baker, J. M., High-                                         Resolution Measurement of Root Water                                          Uptake Using Automated Time-Domain                                            Reflectometry, SOIL SCIENCE SOCIETY                                           OF AMERICA JOURNAL, Vol. 55, pp. 928-                                         932 (1991).                                                          Ref. No. 27                                                                            Yanuka, M., Topp, G. C., Zegelin, S.                                          and Zebchuk, W. D., Multiple                                                  Reflection and Attenuation of Time                                            Domain Reflectometry Pulses:                                                  Theoretical Considerations for                                                Applications to Soil and Water, WATER                                         RESOURCES RESEARCH, Vol. 24, No. 7,                                           pp. 939-944 (July, 1988).                                            Ref. No. 28                                                                            Zegelin, S. J., White, I. and Jenkins,                                        D. R., Improved Field Probes for Soil                                         Water Content and Electrical                                                  Conductivity Measurement Using Time                                           Domain Reflectometry, WATER RESOURCES                                         RESEARCH, Vol. 25, No. 11, pp. 2367-                                          2376 (November, 1989).                                               Ref. No. 29                                                                            Zimmerman, A., The State Of The Art                                           In Sampling, TEKTRONIX SERVICE SCOPE                                          No. 52, pp. 1-7 (October, 1968).                                     ______________________________________                                    

While TDR systems have been known and used for decades innon-agricultural fields such, for example, as in the telecommunicationfield, their application to agricultural fields and for use inmeasurement of soil water content and/or moisture profiles began to beseriously explored in or about the late 1960s and the early 1970s.Malicki et al., Ref. No. 13. Prior to that time, the more widely usedsystems and/or equipment for measurement of soil water content included,merely by way of example: i) neutron modulation or scattering; ii)neutron probes; iii) gamma attenuation; iv) gravimetric andthermogravimetric systems; v) lysimetry; vi) tensiometers; and vii),gypsum blocks. These conventional techniques, and some of thedisadvantages inherent in their use, have been described in theliterature. Baker et al., Ref. No. 3; Dalton et al., Ref. No. 5; and,Topp et al., Ref. No. 23. However, despite their known disadvantages,such conventional systems have continued to be utilized in the field asdesign, development and experimental work with TDR systems haveprogressed.

Use of TDR systems to measure, for example, soil water content has manyadvantages over the known conventional systems described above such,merely by way of example, as:

i) excellent spatial resolution (Baker et al., Ref. No. 4);

ii) ability to measure close to the soil surface (Topp, Ref. No. 20;and, Zegelin et al., Ref. No. 28);

iii) excellent multiplexing capability (Baker et al., Ref. No. 3; and,Zegelin et al., Ref. No. 28);

iv) potential for accuracies greater than 2×10⁻² m³ /m³ (Topp, Ref. No.20; and, Topp, et al., Ref. No. 24);

v) potential for rapid reading in the field with only minimal soildisturbance (Baker et al., Ref. No. 4; Kachanoski et al., Ref. No. 13;and, Roth et al., Ref. No. 19); and,

vi) measurements of volumetric water content appear to be substantiallyindependent of soil type and salinity for many, if not most, soilenvironments (Dasberg et al., Ref. No. 7; Fellner-Feldegg, Ref. No. 9;and, Topp et al., Ref. Nos. 21, 23 and 24).

Considerable work in soil evaluation and various agriculturalapplications using Time Domain Reflectometry has been carried out in thepast and has been widely reported. See, Ref. Nos. 3, 5-8, 13-16, and19-26. In the course of that work some improved and excellenttransmission line or probe geometries have been developed. Zegelin etal., Ref. No. 28 and International Publication No. W089/12820 based onWhite et al. International Patent Application No. PCT/AU89/00266.

Measurement of the propagation velocity V of an electromagnetic wave inmoist soil as it travels along a transmission line or probe is basic tothe TDR soil water content method. Topp et al., Ref. No. 21. Thus, in atypical instance for measuring soil water content, a transmission lineor probe having physical discontinuities present at two known locationsX₁, X₂ along the line separated by a distance X₂ minus X₁ (where X₂represents the end of the transmission line and X₁ represents, forexample, the coaxial cable/transmission line interface) is imbedded inthe soil. The time that a reflection from the discontinuity at point X₁arrives back at the TDR instrument may be designated T₁, while the timethat the reflection from the discontinuity at point X₂ arrives back atthe TDR instrument may be designated T₂. Thus, the propagation velocityV is: ##EQU1## As described in Ledieu et al., Ref. No. 14, thepropagation velocity V is usually normalized to the speed of light (c)in space using the apparent dielectric constant formula:

    K.sub.a =(c/V).sup.2 ;                                      2!

and, since (c) is a known quantity and the propagation velocity V is ameasurable quantity, the apparent dielectric constant K_(a) of thematerials surrounding the probe can be calculated to provide, forexample, a direct indication of the moisture content of the testmaterial. This is possible because the apparent dielectric constantK_(a) of moist soils changes substantially as water saturation risessince there is a large contrast in the dielectric constant K of waterand that of most dry soil solids. Alharthi et al., Ref. No. 1.

However, one of the most significant problems heretofore encountered inTDR measurement systems resides in the fact that the actual values ofT₁, T₂, X₁ and X₂ are extremely critical; and, even relatively smallerrors can result in significant errors in the calculation of the testmaterial's apparent dielectric constant K_(a). Where the TDR system isemployed to determine material level in a container, liquid profiles, orthe liquid content of the test material, an error in calculating theapparent dielectric constant K_(a) will, of course, result in asignificant error in the ultimate calculated result.

Minimal performance and design criteria for a basic probe to be usedwith TDR instruments include, for example:

i) fast rise times for T₁ and T₂ reflections;

ii) amplitudes for T₁ and T₂ reflections which are at least 90% of themaximum available amplitude--i.e., the amplitude of the reflection fromthe unterminated end of the coaxial connector cable;

iii) minimal electromagnetic pickup; and,

iv) minimal cost.

Probes that employ only passive elements cannot meet the foregoingcriteria. Excellent examples of such probes include, for example, thosedisclosed by Zegelin et al., Ref. No. 28 and International PublicationNo. WO89/12820 based upon White et al. International Patent ApplicationNo. PCT/AU89/00266.

It is known that the amplitude of the T₁ reflection can be increased byadding passive elements such as reactive components or impedance changesat or near X₁. Ledieu et al., Ref. No. 14; and, Malicki et al., Ref. No.15. Ledieu et al., Ref. No. 14, employs, for example, two passive diodesin opposition which are soldered to the front ends of the two parallelprobe transmission lines adjacent their interface with the coaxialcable. This approach has, however, proven to be highly limited becauseof the loss of energy at X₁ induced by the two (2) passive diodes whichcreate the T₁ reflection and which serves to significantly reduce theamplitude of the T₂ reflection since the loss occurs twice--i.e., onceas the electromagnetic wave is propagated down the coaxialcable/transmission line and a second time as the reflection from pointX₂ passes back through the transmission line/coaxial cable to the TDRinstrument. This problem is exacerbated by the use of long connectingcables--e.g., cables up to one hundred (100) meters in length ormore-having reduced high frequency transmission characteristics. As aconsequence, such TDR systems have limited cable lengths and requireextremely expensive, high-performance TDR instruments and waveformprocessors in order to detect the weak T₂ reflection. However, even withan expensive high-performance system, the weak T₂ reflections can, andoften do, generate false data.

The use of a strip line probe or transmission line--i.e., a generallyone-piece, blade-like, integral probe defined by parallel conductivestrips formed on a printed circuit board is described byFellner-Feldegg, Ref. No. 9. The author suggests covering the twoparallel conductive strips with dielectric material to reduce thecharacteristic impedance of the line.

Experimentation with TDR systems has revealed that the impedancemismatch between coaxial cables and 2-conductor probes introduces anerror source into the measurements. It has, therefore, been proposedthat a balun transformer be employed to compensate for that impedancemismatch. Dalton et al., Ref. Nos. 5 and 6; Dasberg et al., Ref. No. 8;Nadler et al., Ref. No. 16; Topp, Ref. No. 20; Topp et al., Ref. Nos. 23and 24; and, Wraith et al., Ref. No. 26. However, the use of a baluntransformer not only significantly increases the cost of the system but,moreover, balun transformers are, themselves, a source of errorproblems. Zegelin et al., Ref. No. 28.

When using 3 or 4-rod probes such as disclosed by Zegelin et al., Ref.No. 28 and in International Publication No. WO 89/12820 based upon Whiteet al. International Patent Application No. PCT/AU89/00266--probes whichpresent significant improvements over other conventional probes in thatthey are configured to minimize impedance mismatches between the probeand the interconnecting coaxial cable--it has been found that the T₂reflections can be significantly reduced by physical and/or moisturelayers within soil. Thus, reflections are reduced in amplitude by suchlayering discontinuities which serve to change the impedancecharacteristics of the transmission line; and, the intermediatereflections caused by the transmission line impedance change at suchlayered discontinuities become undesirable background noise. Thisbackground noise may not only cause false readings but, moreover, maymerge with the true T₂ reflection to create significant delay errors.Nadler et al., Ref. No. 16. Indeed, for heavily layered soils, the T₂reflection can become undetectable by any conventionally employeddetection/measurement system.

Topp et al., Ref. No. 22, describes a multiple segment probe wherein thetransmission line is designed to produce electrical discontinuities andconsequent changed impedance characteristics at known locations alongthe line by, for example, varying the diameter of the solid brass rodsused in the probe at selected points or by employing transmission linesformed of solid polystyrene having spaced areas coated with silver paintand joined by copper tape. However, the intermediate reflections fromthe electrical discontinuities are even smaller in amplitude than thesmall natural reflection from the transmission line end; and,consequently, the signal-to-noise ratio is even lower than theconventional T₂ reflection. Field use of this type of probe has not beenwidely reported in the literature.

Computer-controlled TDR systems have been described in the prior art formaking large numbers of soil water content measurements at differentsites at predetermined time intervals (Heimovaara et al., Ref. No. 11)and for use with layered soil media (Yanuka et al., Ref. No. 27).Automated and multiplexed TDR systems are described in, for example,Baker et al., Ref. No. 3. In other instances, soil water content hasbeen measured with manually-controlled TDR systems. Malicki et al., Ref.No. 15.

Numerous prior art patents are also available relating to the use of TDRsystems for a wide range of applications. For example, U.S. Pat. No.3,771,056-Zimmerman discloses a display baseline stabilization circuithaving a sampling system used to determine the size and location of anydiscontinuities in the characteristic impedance of the transmissionline. The apparatus employs a switch to change the impedancecharacteristics at the end of the coaxial cable transmission line andthus provide one of several switchable, identifiable impedance changesat the probe terminus.

In U.S. Pat. No. 3,789,296-Caruso, Jr. et al., the patentees describe anapparatus for sensing the moisture content and, therefore, the amount ofdielectric coating applied to a web-like carrier as the latter is passedbetween the sensing bars of a TDR system.

In Wrench, Jr. et al. U.S. Pat. No. 4,109,117, the patentees describe aTDR system in combination with a multiplexing technique for allowing theseparation of signals from many transducers on a single coaxial cablepassing through multiple sites. In this arrangement it is proposed touse variable impedances equally spaced along a transmission line whereinthe variable impedances are in the form of field effect transistors(FETs) or microphones which produce discontinuities in the cableresulting in reflections that are sensed by the TDR system. Wrench, Jr.et al. are not, however, concerned with the measurement of propagationvelocity.

In U.S. Pat. No. 4,786,857-Mohr et al., the patentees disclose the useof a TDR system having a coaxial transmission line with a passiveterminating resistor to provide an identifiable impedance change at theprobe terminus in a fashion somewhat similar to that disclosed inZimmerman U.S. Pat. No. 3,771,056. The Mohr et al. apparatus is used todetermine the relative proportions of intermixed constituents in amulti-phase fluid system.

Malicki et al. U.S. Pat. No. 4,918,375 is of interest for its disclosureof a TDR system for the measurement of soil water content using aTektronix Model 1502 TDR acquired from Tektronix Corp., Beaverton, Oreg.In this system the patentees employ step-wise, local, specific, passiveimpedance discontinuities above the air/soil interface to establish areference time for multiple parallel transmission lines.

Numerous other patent disclosures are of miscellaneous interest in thatthey disclose other types of systems, bearing certain similarities toTDR systems, for various applications. For example, in U.S. Pat. Nos.3,853,005-Schendel and 3,995,212-Ross, the patentees insert transmissionlines into a liquid container and use the reflection from the air/liquidinterface to determine the level of liquid. A somewhat similararrangement is disclosed in U.S. Pat. No. 4,135,397-Krake wherein thetransmission line is inserted into a grain elevator with thetransmission line having a passive load impedance Z₁ equal to thecharacteristic line impedance for terminating the transmission line.Again, the reflected pulse from the air/grain interface is indicative ofthe level of grain.

Wann U.S. Pat. No. 4,949,076 discloses a leak detector employing acoaxial cable used to detect reflected signals from a leak location withthe coaxial cable employing a passive terminating resistor.

A somewhat different system is disclosed in Statutory InventionRegistration No. H395-Nash wherein the registrant uses a coaxial cableto generate an electrical field at the end of the cable which isattenuated by the electrical characteristics of the material undergoingtest; and, the attenuation in the reflected wave is then observed.

Other patents of miscellaneous interest include: i) U.S. Pat. No.4,013,950-Falls a probe for measuring electromagnetic impedancecharacteristics of soils!; ii) U.S. Pat. Nos. 4,281,285-Bastida and4,341,112-Mackay et al. the use of RF radiation to provide an indicationof soil water content!; iii) U.S. Pat. No. 4,754,214-Bramanti et al. asystem for determining the amount of coal in furnace ash using areflected microwave signal!; and iv), U.S. Pat. No. 4,807,471-Cournaneet al. a swept frequency system wherein the transmission line conductorsare terminated by a passive variable impedance device such as a PINdiode for level measurement in storage silos!.

Other prior art patents of general interest which do not relate toeither TDR systems and/or to systems for measuring soil water contentcan be found in the art relating to transmission lines as used invarious electronic devices. These include, merely by way of example,Oberbury U.S. Pat. No. 3,757,222 which discloses an RF system, andparticularly, a single sideband generator employing diodes which areconnected to ground along the length of the transmission line fordefining switchable short circuits to advance or retard the phase of thesignal at the load in digital steps. Similarly, Bakken U.S. Pat. No.3,829,796 discloses an electronic amplitude modulator for use innavigational systems using diodes positioned along the transmission lineto provide step-wise variation of the phase angle φ and, thereby, of theamplitude of the signal voltage.

U.S. Pat. No. 4,349,795-Kwok discloses an amplifier station for thetrunk system in cable TV systems wherein a switching apparatus passes RFsignals in a prescribed frequency band on a main transmission line tofirst and second transmission lines. PIN diodes short opposite ends ofthe first coaxial transmission line for improving isolation of thestation equipment.

UK published Patent Application, Publication No. 2 216 355 A-Gale (1989)discloses a voltage-controlled oscillator using PIN diodes soldered to amicrostrip transmission line to provide distributed capacitance.

A wide range of other devices have been used to short transmission linesfor a wide range of purposes. These include, merely by way of example:i) U.S. Pat. No. 3,551,677-Brewster a field reversal type pulsegenerator with a shorting switch formed by a plurality of parallel gasdielectric spark gaps connected across one end of the transmissionline-the spark gaps are subjected to ultraviolet light to enable them tobreak down so as to permit the transmission line to discharge and causethe pulse generator to produce an output pulse!; ii) U.S. Pat. No.3,993,933-Menninga an electric overvoltage gas arrester with a metallicshorting mechanism to prevent overheating of a surge voltage gas tubeused to protect equipment connected to telephone and other transmissionlines!; iii) U.S. Pat. No. 4,755,769-Katz a composite power amplifierwherein the output of a plurality of amplifiers are combined to producea higher output signal-shorting switches are coupled to the transmissionline and are selectively rendered conductive to adjust impedance andmaintain impedance matching!; iv) U.S. Pat. No. 4,782,313-Brant, Jr. atransmission line shorting switch for preventing transmission of signalsalong unbalanced transmission lines!; and v), UK Pat. No.1444540-Heading an electrical filter which uses a conductive track andwiper assembly on a transmission line to adjust bandwidth!.

Notwithstanding the extensive reported work to date relating to TDR ingeneral and specific TDR applications in respect of soil water Contentmeasurement, both in the literature and in patents, it has been foundthat the successful implementation of a TDR soil water contentmeasurement system comprising a commercially acceptable system useful inthe field has continued to suffer from numerous practical and/orcost-related limitations such, merely by way of example, as:

i) the complexity and high cost of conventional TDR instrumentation and,particularly, high-performance TDR instruments;

ii) the difficulties in detecting and accurately measuring relativelyweak reflections of interest and/or distinguishing such reflections ofinterest from background noise;

iii) poor signal-to-noise ratios inherent in most conventional TDRsystems;

iv) the unreliability of soil water content measurements in layeredand/or highly saline soil;

v) signal attenuation inherent in transmission lines, thus precludingthe usage of long cables and thereby limiting site coverage or requiringmultiple TDR systems for relatively large sites; and,

vi) the inability to reliably measure moisture profiles using a singlevertical probe.

SUMMARY OF THE INVENTION

The foregoing practical and/or cost-related limitations anddisadvantages inherent in reported prior art TDR methods and apparatushave been overcome by the present invention which provides forincorporation of active, as contrasted with passive, remotely operatedvariable impedance devices such, merely by way of example, as at leastone, and preferably n pair(s) (where "n" is any desired whole integer)of shorting diodes interconnecting the parallel transmission lineconductors at selected, known, spaced points X₁, X₂ . . . X_(n) alongthe effective length of the probe. As a consequence of this arrangement,the reflections generated at each discontinuity produced by activatingthe variable impedance devices--e.g., by biasing a given diode D_(n) toconduction to short the transmission lines at a known pre-selected pointX_(n) --are characterized by their relatively large amplitudes and theirunambiguous signals. In short, these objectives are achieved withouthaving to increase the amplitude of transmitted pulses, but, rather, byemployment of probes having remotely operated active elements capable ofestablishing precise timing markers T₁, T₂ . . . T_(n) of readilydiscernable amplitude and polarity.

More specifically, the present invention employs remotely operated,active, variable impedance devices mounted on the probe or probe adapterto greatly increase the amplitude of, and therefore the detectabilityand measurability of, the T₁, T₂ . . . T_(n) reflections. Thus, whenusing remotely operated, active, variable impedance devices such asremotely operated switches or shorting diodes, when any given variableimpedance device is rendered conductive to short the transmission line,a strong negative reflection T_(n) is reflected from point X_(n) ; but,when the impedance device is remotely biased to a non-conductive state,the circuitry permits propagation of the electromagnetic pulses down thetransmission line past point X_(n) without change except for attenuationinherently resulting from the natural impedance characteristics of thetransmission line.

The probes can be configured so that the remotely operable variableimpedance devices accurately define the air/soil or other air/materialinterface, or both the interface and the probe end, or any other spacedselected points X₁, X₂ . . . X_(n) along the probe. When two (2) diodesor other variable impedance devices are employed, they are installedwith opposite polarities. Consequently, when the bias insertion networkproduces a positive voltage output, the diode D₁ at, for example, pointX₁, is rendered conductive to short the transmission line at X₁ ; whenthe bias insertion network produces a negative voltage output, the diodeD₂ at point X₂ is rendered conductive to short the transmission line atpoint X₂ ; and, when the bias insertion network produces a zero volt(0v) output, both diodes D₁ and D₂ remain open and permit the transit oftransmitted pulses and reflections as if no discontinuity was present.

When more than one pair of diodes or other variable impedance devicesare employed, the probe is configured as a multi-segment probe having adiode located at each segment boundary. Such an arrangement requiresthat the diodes be AC coupled to the transmission line with a separatecontrol wire for the second pair and each additional pair of diodelocations--i.e., for diode pairs D₁ /D₄ . . . D_(n-3) /D_(n-2).

The invention permits the probe to be configured as an averaging probeby connecting a plurality of discrete moisture sensitive transmissionlines in series using intervening interconnecting cables; and, placingdiodes D₁ and D₂ at the start and end of the series-connectedtransmission lines.

In another of its important aspects, the invention permits of use ofsynchronous detection techniques for processing signals at first andsecond precise Timing Markers T₁, T₂ where such signals arerepresentative of probe reflections derived from either of: i) shortablediodes, or similar shortable variable impedance devices, to provideremotely shortable diode ON/OFF modulation; or ii), a variable timedelay mechanism having the capability of being rapidly switched betweentwo preset time delay circuits so as to establish unambiguousreflections at first and second time delays T_(A), T_(B) to generate asquare wave having an amplitude proportional to the slope of thereflection--i.e., time delay modulation.

Stated in other words, it is a general aim of the present invention toprovide improved TDR methods and apparatus for generating relativelyhigh amplitude, unambiguous, timing markers T₁, T₂ . . . T_(n)characterized by their accuracy, reliability and magnitude and,therefore, by their observability and measurability; yet, which arehighly cost effective and can be provided for but a fraction of the costof conventional TDR systems.

More specifically, it is an important objective of the present inventionto provide improved probes and/or adaptors for conventional prior artprobes characterized by the employment of at least one (1) remotelyoperated, active, variable impedance device--and, preferably, one (1) ormore pairs of remotely operated, active, variable impedancedevices--which can be selectively and/or sequentially renderedconductive to establish a momentary short in the transmission line, thusproducing an electrical discontinuity for generating a relatively largeamplitude reflection T_(n) serving as a reliable, observable andmeasurable timing marker.

In this connection, it is an object of the invention to provide probesand/or probe adaptors for use in TDR systems wherein the transmissionline probe and/or adaptor is provided with remotely operable, active,variable impedance devices for establishing precise timing markers andwhich can readily be employed with differential detection apparatus andmethods to provide maximum amplitude reflections at precise,pre-established and known spaced points X₁, X₂ . . . X_(n) and ataccurately measured times T₁, T₂ . . . T_(n).

In another of its important objectives, the invention readily permits ofthe use of waveform subtraction techniques which make the system moretolerant to, for example, spurious reflections often found withmismatched and inexpensive components, thereby allowing the system to bedesigned using less complex and, therefore, less expensive TDRinstruments. Moreover, waveform subtraction techniques are also usefulfor reducing background noise attributable to, for example, unwantedreflections from layered soils and similar discontinuity reflectionsthat are not of interest.

It is a related object of the invention to provide a TDR system which,because of the significantly larger T_(n) reflections, allows the use ofless expensive cable and multiplexers; and, which also permits use oflonger cables and, therefore, greater site coverage, all resulting in asignificant reduction in overall system cost.

A more detailed object of the present invention is the provision of aTDR system characterized by its ability to reliably detect n reflectionsat n pre-established, precise and known timing markers defined by nremotely operable, active, shorting diodes (where "n" is any desiredwhole integer).

It is an object of the invention to provide a TDR system characterizedby significant improvement in signal-to-noise ratio. To achieve thisobjective, the present invention employs remotely operable, active,variable impedance devices--e.g., diodes--to establish precise timingmarkers and which can be used in combination with differential detectiontechniques resulting in: i) increase of the effective amplitude ofsignal reflections of interest; ii) significant reduction in backgroundnoise; and iii), significant improvement in signal-to-noise ratio. Oneexample of a differential detection technique is waveform subtraction, atechnique which permits elimination of substantially all backgroundnoise.

As a result of achieving the foregoing objectives it is possible to makeaccurate measurements of volumetric water content in either saline orlayered soils. It is further possible to make accurate reliablemeasurements of soil water content and/or other material liquid contentusing relatively long coaxial interconnection cables having lengths upto on the order of at least one hundred (100) meters; and, to accuratelydetect the times of arrival of reflection signals of interest even wherethe reflection signal is attenuated by a factor up to on the order of2500:1. Rapid and reliable measurement of soil water and/or othermaterial liquid contents are achieved over a wide range of operatingconditions using either manual or automated processes, readouttechniques and equipment. Additionally, it is possible to make accurateand reliable measurements of material levels in containers, as well asdetermination of the dielectric constant K of a wide range of materialsundergoing test including soils, grains, particulate materials, solidmaterials, and the like. Moreover, a plurality of transmission lineprobes can be used through multiplexing techniques wherein a coaxialswitch arrangement is interposed between the individual probes and thebias insertion network used for selectively rendering switchablevariable impedance devices in the probes conductive or non-conductive.

DESCRIPTION OF THE DRAWINGS

These and other objects and advantages of the present invention willbecome more readily apparent upon reading the following DetailedDescription and upon reference to the attached drawings, in which:

FIG. 1 is a highly diagrammatic, schematic, fragmentary, block-and-linedrawing, partly in section, here illustrating a typical prior art systemfor measurement of moisture content in test materials such, merely byway of example, as soil environments, and here incorporating aconventional, commercially available, off-the-shelf Time DomainReflectometer and a conventional probe employing two spaced, parallel,rod-like conductors for insertion into the test material;

FIG. 2 is a highly diagrammatic, fragmentary, schematic drawing, partlyin section, here depicting a modified form of conventional prior artprobe employing three spaced parallel conductors for insertion into atest material, such modified probe also being suitable for use with theoverall test system depicted in FIG. 1;

FIG. 3 is a plot of voltage versus time and depicts a representativereflection waveform of the type generated using the conventional priorart measurement system shown in FIG. 1 with a conventional probe of thetype shown in either FIG. 1 or FIG. 2;

FIG. 4 is a highly diagrammatic, schematic, fragmentary, block-and-linedrawing, partly in section, which is similar to the prior art systemshown in FIG. 1, again employing a conventional, commercially available,off-the-shelf Time Domain Reflectometer coupled to a two-pronged probeby means of a suitable RF cable which here takes the form of aconventional coaxial cable, but here illustrating an overall systemincluding features embodying the present invention in that: i) the probeis provided with a pair of remotely operable, normally open ornon-conductive, variable impedance devices--e.g., diodes--forselectively establishing timing markers; and ii), the circuitry depictedincludes a suitable bias insertion network for permitting remote controlof the variable impedance devices;

FIG. 5 is a plot of voltage versus time substantially identical to thatshown in FIG. 3, again illustrating a representative reflection waveformof the type commonly generated with layered soil when using the systemdepicted in FIG. 4 and when the two variable impedance devices or diodesare both open;

FIG. 5A is a plot of voltage versus time similar to that shown in FIG.5, but here illustrating the representative reflection waveform as itappears when the first variable impedance device on the probe closest tothe air/soil interface is remotely biased into conduction while thesecond variable impedance device remains open, thereby shorting the twoparallel probe conductors one to the other so as to establish a firsttiming marker T₁ ;

FIG. 5B is a plot similar to that shown in FIGS. 5 and 5A, but hereillustrating the representative reflection waveform produced when thesecond variable impedance device closest to the distal probe ends isremotely biased into conduction while the first variable impedancedevice remains open, thereby again shorting the two parallel probeconductors one to the other so as to establish a second timing marker T₂;

FIG. 6 is a plot illustrative of the difference waveform obtained whensubtracting the shorted waveforms of FIGS. 5A and 5B from the openwaveform of FIG. 5 and illustrative of: i) elimination of backgroundnoise prior to shorting of the variable impedance devices; ii) improvedsignal-to-noise ratio; and iii), the provision of definitive andaccurate timing markers T₁, T₂ established at the intersections of thezero difference line and a best fit straight line through thepositive-going ramps;

FIG. 7 is a diagrammatic block-and-line schematic drawing of a firstprobe embodying features of the present invention here illustrating atwo-prong, two diode probe coupled to a suitable RF cable;

FIG. 8 is a drawing similar to that shown in FIG. 7, but here depictinga second probe embodying features of the invention employing threespaced parallel probe conductors and three remotely operable shortingdiodes;

FIG. 9 is a drawing similar to that shown in FIG. 7, but depicting athird probe embodying features of the present invention, here employingtwo spaced parallel probe conductors, but only a single remotelyoperable shorting diode;

FIG. 10 is a drawing similar to that shown in FIG. 8, here depicting afourth probe embodying features of the present invention with the probeincluding three spaced parallel probe conductors, but only a singleremotely operable shorting diode;

FIG. 11 is a drawing similar to FIGS. 7 through 10, but hereillustrating a fifth embodiment of the invention, partly in section,comprising an elongate, unitary, generally imperforate, bayonet-typeprobe employing: i) two spaced elongate plate-like conductors; ii) acentral integral spacer formed of dielectric or other suitablenon-conductive material; and iii), a pair of spaced remotely operableshorting diodes for establishing first and second timing markers;

FIG. 12 is a sectional view of the probe of FIG. 11, here takensubstantially along the line 12--12 in FIG. 11;

FIG. 13 is a fragmentary, enlarged, plan view in highly detailedschematic form here illustrating one arrangement for bonding two spacedstainless steel conductors and an intermediate cast epoxy dielectricspacer together to form an integral unitary or one piece bayonet-likeprobe having a pair of spaced, remotely operable, shorting diodeselectrically connected to the stainless steel conductors adjacent theopposite ends thereof;

FIGS. 14 and 15 are sectional views taken substantially along respectiveones of the lines 14--14 and 15--15 in FIG. 13, here illustratingdetails of the structure employed to insure that the stainless steelconductors and epoxy spacer are securely bonded together in a rigid,stable structure;

FIGS. 16 and 17 are sectional views respectively taken substantiallyalong the lines 16--16 and 17--17 in FIG. 13, and here depicting theelectrical connections for the two remotely operable shorting diodes;

FIG. 18 is a fragmentary plan view similar to a portion of FIG. 13, buthere depicting an alternative arrangement for bonding two spacedstainless steel conductors together using a cast resinous epoxydielectric material;

FIG. 19 is a diagrammatic, block-and-line, perspective drawing of aconventional two-prong prior art probe of the type shown in FIG. 1;

FIG. 20 is a plan view, partly in section, here adapted to be placed inside-by-side relation with the conventional probe of FIG. 19 andintended to be considered conjointly therewith, and illustrating anelongate bayonet-type sheath adapted to be mounted on the conventionalprior art probe of FIG. 19 with the probe conductors beingtelescopically received therein, such sheath employing first and secondparallel conductors spaced apart by an integral spacer formed ofdielectric or other suitable non-conductive material and having a pairof variable impedance devices--e.g., remotely operable shortingdiodes--imbedded in the dielectric material and coupled to the sheath'sfirst and second electrical conductors for converting the conventionaltwo-pronged probe of FIG. 19 to a bayonet-like solid probe structurallysimilar and functionally identical to the probe depicted in FIG. 11;

FIG. 21 is an end view of the sheath depicted in FIG. 20 takensubstantially along the line 21--21 in FIG. 20;

FIGS. 22 and 23 are sectional views of the sheath shown in FIG. 20, heretaken substantially along respective ones of the lines 22--22 and 23--23in FIG. 20;

FIG. 24 is a diagrammatic, block-and-line, perspective drawing of aconventional three-prong prior art probe of the type shown in FIG. 2;

FIG. 25 is a plan view, partly in section, similar to FIG. 20, but heredepicting a modified form of bayonet-like sheath adapted to be placed inside-by-side relation with the conventional prior art three-prongedprobe of FIG. 24 and intended to be considered conjointly therewith, andadapted to be slidably mounted on, and engaged with, the conventionalprior art three-pronged probe of FIG. 24 in a manner similar to thatdescribed for the sheath of FIG. 20 so as to convert the conventionalprior art three-pronged probe into a solid, integral, bayonet-like probeembodying features of the present invention which is similar to thesolid, integral two-pronged probe of FIG. 11, differing therefrom inthat the resulting probe employs three spaced parallel conductors andfour remotely operable shorting diodes;

FIGS. 26 and 27 are sectional views of the sheath shown in FIG. 25, heretaken substantially along respective ones of the lines 26--26 and 27--27in FIG. 25;

FIG. 28 is a fragmentary plan view, partly in section, here depicting aspade-like fitting adapted to be slidably mounted on, and engaged with,the spaced conductors of a conventional two-pronged prior art probe ofthe type shown in FIGS. 1 and 19, such fitting including: i) two spacedparallel conductors; ii) a central integral spacer formed of dielectricor other suitable non-conductive material; and iii), a remotely operableshorting diode embedded in the dielectric material for selectivelyshorting one probe conductor to the other;

FIG. 29 is a sectional view of the assembled probe and spade-likefitting shown in FIG. 28, here taken substantially along the line 29--29of FIG. 28;

FIG. 30 is a fragmentary schematic drawing depicting a remotely operableshorting diode probe suitable for use as an averaging probe in seedlingnurseries or the like;

FIG. 31 is a highly diagrammatic, schematic, fragmentary block-and-linedrawing, partly in section, similar to FIG. 4, but here illustrating amodified form of Time Domain Reflectometer electronics employing: i) acircuit to repeatedly switch either diode of a bayonet-like probe suchas that shown in FIGS. 11 and 12 from open to short; ii) a low frequencysynchronous detector signal processing circuit allowing the detection ofthe difference in the amplitude of the sample-and-hold circuit outputarising from the diode-open reflection at time T and the amplitude ofthe sample-and-hold circuit output arising from the diode-shortedreflection at time T with the entire apparatus permitting the directmeasurement of a difference function similar to that shown in FIG. 6;and iii), delay modulation capability for permitting waveformdifferentiation by modulating the time delay in synchronism with theTime Domain Reflectometer repetition rate so as to allow a singleelectronic unit to determine passive as well as active timing markers;

FIG. 32 is a schematic drawing depicting the circuit components employedin the Divide-By-2 and the Diode Drive circuits shown in block form inFIG. 31;

FIGS. 33 and 34 are plots illustrating waveform differentiationperformed using the synchronous detector circuit shown in FIG. 31;

FIG. 35 is a diagrammatic, schematic, fragmentary block-and-linedrawing, partly in section, depicting an elongate, solid, impervious andintegral two-conductor bayonet-type probe embodying features of thepresent invention, but here illustrating the probe with multiple pairsof remotely operable shorting diodes which together define a multiplesegment bayonet-type probe; and,

FIGS. 36A and 36B, when placed in side-by-side relation and viewedconjointly, comprise a highly diagrammatic, schematic, block-and-linedrawing, somewhat similar to FIG. 4, but here illustrating an exemplaryelectrical circuit used for coupling the multiple segment bayonet-typeprobe of FIG. 35 to the modified form of Time Domain Reflectometerelectronics shown in FIG. 31.

While the invention is susceptible of various modifications andalternative forms, specific embodiments thereof have been shown by wayof example in the drawings and will herein be described in detail. Itshould be understood, however, that it is not intended to limit theinvention to the particular forms disclosed; but, on the contrary, theintention is to cover all modifications, equivalents and/or alternativesfalling within the spirit and scope of the invention as expressed in theappended claims.

DETAILED DESCRIPTION

Turning now to the drawings, and directing attention first to FIGS. 1through 3, a conventional prior art TDR system, generally indicated at50, has been illustrated in highly diagrammatic block-and-line form inFIG. 1. As here shown, the basic components of the TDR system 50depicted in FIG. 1 include: i) a conventional TDR unit, generallyindicated at 51; ii) a moisture sensitive probe, generally indicated at52, adapted to be inserted into the soil or other medium to be tested(not shown); and iii), a coaxial cable, generally indicated at 54, forcoupling the probe 52 to the TDR unit 51.

The conventional TDR unit 51 here shown in diagrammatic form comprisesan off-the-shelf Model 1502B TDR instrument available from TektronixCorp., Beaverton, Oreg. As those skilled in the art will appreciate,such a conventional TDR unit employs: i) an RF section 55 including aPulse Generator 56 for generating fast rise time pulses on the order ofapproximately 200 picoseconds, a Sample-And-Hold circuit 58 for samplingreflected signals, and a Delay unit 59; ii) a Signal Processor Section60; and iii), a Digital Display 61. The conventional probe 52 comprisesa 2-conductor probe including a pair of parallel conductors 62, 64 whichare preferably formed of stainless steel rods having diameters on theorder of 0.125" mounted at one end in a dielectric support member orbase 65. Coaxial cable 54 includes: i) a central conductor 66 which iscoupled at one end to the Pulse Generator/Sample-And-Hold circuits 56/58and at its other end to one of the pair of probe conductors--here,conductor 62--and ii), a surrounding coaxial cable shield 68 coupledboth to the second probe conductor 64 and to ground.

Referring to FIG. 2, a slightly modified, but completely conventional,3--conductor probe 69 of the type developed and described by Zegelin etal., Ref. No. 28, and in International Publication No. WO89/12820 basedupon White et al. International Patent Application No. PCT/AU89/00266,has been depicted. As here shown, probe 69 includes a central, rod-like,stainless steel conductor 70 and a pair of spaced, outer, parallel,rod-like stainless steel conductors 71, 72. In this arrangement, thecentral conductor 66 of the coaxial cable 54 is coupled to the probe'scentral stainless steel conductor 70, while the coaxial cable shield 68is coupled to the outer stainless steel conductors 71, 72. Thus, thearrangement of probe conductors 70, 71, 72 tends to emulate theconstruction of a typical coaxial cable, thereby minimizing impedancemismatches between the coaxial cable 54 and the probe 69 at thecable/probe interface 54/69.

In operation, the conventional TDR unit 51 depicted in FIG. 1 generatesa series of relatively fast rise time--e.g., approximately 200picoseconds--step pulses which are propagated down the coaxial cable 54and along the transmission line defined by the probe conductors 62, 64(FIG. 1) or the probe conductors 70, 71, 72 (FIG. 2) which have beeninserted into a soil or other medium (not shown) undergoing test. Aseach pulse wavefront reaches the distal ends of the probe conductors 62,64 (FIG. 1) or 70, 71, 72 (FIG. 2), it is reflected off the end of thetransmission line with the reflected signals traveling back up thetransmission line probe/coaxial cable 62, 64/54 or 70-72/54 to the TDRSample-And-Hold circuit 58. The TDR unit 51 then measures the shape ofthe reflection waveform 75, thereby permitting a determination of thetime of arrival T_(n) of each reflection of interest.

A typical and completely conventional reflection waveform has beenillustrated at 75 in FIG. 3. Those skilled in the art will appreciatethat the reflection waveform 75 is defined by a series of reflectionsincluding not only the reflections from the distal ends of the probeconductors which arrive at the TDR unit 51 at time T₂ and thereflections from the air/soil interface which arrive at the TDR unit 51at time T₁, but, additionally, numerous other reflections such as areflection from the coaxial cable/probe interface 54/52 (69)--areflection which may be coincident with, or very close in time to, thereflection from the air/soil interface which arrives at time T₁, as wellas numerous other spurious reflections intermediate times T₁ and T₂generated by electrical discontinuities along the length of the probewhich are attributable to, for example, layer interfaces in layered soiland/or other dielectric discontinuities all contributing to undesirablebackground noise. In addition, the presence of salt in the soil--acondition termed "saline soil"--will attenuate the desired reflectionsfrom the distal ends of the probe conductors which arrive at the TDRunit 51 at time T₂ --i.e., the presence of salt in the soil reduces theamplitude of the natural reflections, making them more difficult todistinguish from background noise.

The problems attributable to usage of conventional TDR systems of thetype hereinabove described are directly related to the accuracy andreliability of the data measured representing the time of arrival of thetwo specific reflections of interest--i.e., the reflection from theair/soil interface arriving at time T₁ and the reflection from the endsof the probe conductors arriving at time T₂ --and accuratelydistinguishing those two reflections of interest from the clutter ofreflected signals of no interest. Thus, in FIG. 3, the times ofinterest--i.e., times T₁ and T₂ --when the two reflections of interestare received at the TDR unit 51 represent, at best, loose approximationsbased upon the observed shape of the waveform 75 and the operator'sjudgment as to which two (2) points along the waveform are, in fact, thetwo reflections of interest which define the specific times of arrivalT₁, T₂ of interest--viz., reflections from the air/soil interface andthe probe's distal end. Of course, if the operator happens to select oneor two points along the waveform 75 defined by one or two spuriousreflections rather than the true reflection(s) of interest, then theparticular time(s) of arrival T_(n) of the selected spuriousreflection(s) which is(are) determined will introduce error into thecalculation of the propagation velocity V of the electromagnetic pulses.

In short, any determination of the two points along the probe where thetwo (2) reflections of interest are generated and the times of arrivalT₁, T₂ of those reflections can, in the absence of very sophisticatedsoftware and its attendant significantly increased cost, makecomputation of the propagation velocity V in conventional TDR systems ofthe type illustrated in FIGS. 1 through 3 highly questionable and proneto significant error. Since the propagation velocity V of the wavefrontsforming the fast rise time step pulses is dependent upon the preciselocations X₁, X₂ of the two points where the reflections of interestoccur and the exact times of arrival T₁, T₂ of those reflections back atthe TDR unit 51--See, equation 1!, supra--such computations represent,at best, crude approximations of the propagation velocity V and,therefore, of the apparent dielectric constant K_(a) of the medium beingtested. Unfortunately, however, significant errors have been, andcontinue to be, generated because of the lack of precision and accuracyin distinguishing the reflections of interest from spurious reflectionscomprising background noise and in determining precisely where suchreflections of interest were generated and what the times of arrival ofthe reflected signals at the TDR instrument are.

In accordance with one of the important aspects of the presentinvention, provision is made for modifying the conventional TDR system50 depicted in FIG. 1 so as to insure generation of waveform reflectionsat times T₁, T₂ . . . T_(n) which: i) are unambiguous; ii) are ofreadily observable and measurable amplitude and polarity; iii) areimmediately distinguishable from other background reflections of nointerest; iv) occur at fixed, known and precise pre-established pointsX₁, X₂ . . . X_(n) along the length of the probe; and v), generatesignificant and instantly observable reflections at precise timingmarkers T₁, T₂ . . . T_(n). To accomplish this, and as best illustratedin FIG. 4, a conventional Model 1502B TDR, generally indicated at 51,identical to that shown in FIG. 1, is coupled to a probe 52' embodyingfeatures of the present invention and having a pair of spaced parallelconductors 62, 64 by means of a coaxial cable 54 identical to thatdepicted in FIG. 1 which is coupled at one end to the probe 52' and atthe other end to the TDR unit 51 in precisely the same manner aspreviously described. In this instance, however, the probe 52' isprovided with a pair of oppositely directed, remotely operable, normallyopen, variable impedance devices 76, 78 electrically coupled across theprobe conductors 62, 64 at two fixed, known and precise pre-selectedpoints X₁, X₂. Since those two points X₁, X₂ are predetermined and knownwith exactitude, the distance that a propagated pulse and a reflectionthereof will travel--viz., 2(X₂ -X₁)--is a precise and accurate quantityin all subsequent determinations of the propagation velocity V ofelectromagnetic pulses for that particular transmission line probe; and,the only remaining variables to be determined are T₁, T₂. In theexemplary form of the invention here shown, the remotely operablevariable impedance devices 76, 78 respectively comprise oppositelydirected PIN diodes D₁, D₂.

In order to selectively render one, and only one, of the variableimpedance devices 76, 78--e.g., the PIN diodes D₁, D₂ --conductive so asto selectively establish an electrical short across the probe conductors62, 64 at either point X₁ or point X₂, thereby generating unambiguousreflections serving to establish accurate and precise timing markers T₁,T₂ for reflections from those two accurately known points, the TDRsystem 50' depicted in FIG. 4 further includes a suitable bias insertionnetwork, generally indicated at 79, interposed in the coaxial cable 54for selectively forward biasing the variable impedance devices 76, 78 toconduction. To this end, the exemplary bias insertion network 79includes a voltage source diagrammatically illustrated as a battery 80having its positive terminal 81 coupled to the positive input terminals82, 84 of a pair of remotely operable, ganged, parallel switches S1, S2and its negative terminal 85 coupled to the negative input terminals 86,88 of the switches S1, S2. Switches S1, S2 may be manually operatedusing any suitable switch controller 89; or, alternatively, they may beelectronically controlled by signals (not shown) output from the TDRunit 51; or, if desired, both the switches S1, S2 and the TDR unit 51may be automatically and remotely controlled from any suitable computer(not shown).

In any event, when the switches S1, S2 are in the solid line positionsdepicted in FIG. 4, the variable impedance devices 76, 78--e.g., diodesD₁, D₂ --are electrically isolated from the bias voltage provided by thebattery 80 or other voltage source; and, consequently, both variableimpedance devices 76, 78--e.g., diodes D₁, D₂ --remain open ornon-conductive. Consequently, electromagnetic pulses propagated down thecoaxial cable 54 and over the transmission line probe 52' remainessentially unaffected by the presence of such devices.

If, on the other hand, the switches S1, S2 are shifted by actuation ofthe switch controller 89 to the dashed line positions depicted in FIG.4, the positive terminal 81 of the voltage source 80 is directly coupledvia series resistors R1, R2 to the central conductor 66 of the coaxialcable 54 and thence to probe conductor 62, while the negative terminal85 of the voltage source 80 is coupled directly to the coaxial cableshield 68 and thence to probe conductor 64. This serves to forward biasvariable impedance device 76 (diode D₁) into conduction, creating amomentary short circuit across the probe conductors 62, 64 at point X₁.

Finally, if the switches S1, S2 are shifted by action of the switchcontroller 89 to the dotted line positions shown in FIG. 4, the positiveterminal 81 of the voltage source 80 is coupled directly to the coaxialcable shield 68 and thence to probe conductor 64, while the negativeterminal 85 of the voltage source is coupled via series resistors R1, R2to the central conductor 66 of the coaxial cable 54 and thence to probeconductor 62, thus forward biasing variable impedance device 78--e.g.,diode DE-to conduction and shorting the probe conductors 62, 64 at pointX₂.

In order to protect the TDR unit from damage due to switching transientsand DC voltages, a transient filter is provided in the bias insertionnetwork 79 by resistor R1 (a 47 ohm resistor in the exemplary circuit),resistor R2 (220 ohms), capacitor C1 (0.047 microfarads) providing a DCblock, capacitor C2 (1.0 microfarads), and by-pass capacitor C3 (0.01microfarads). The use of the bias insertion resistor R2 and the by-passcapacitor C3, together with short lead lengths, insures achievement ofthe desired fast rise time electromagnetic step pulses.

Considering now FIGS. 5, 5A and 5B conjointly with FIG. 4, and referringfirst to FIG. 5, a typical waveform 75 identical to that shown in FIG. 3has been depicted under conditions where the switches S1, S2 in FIG. 4are positioned in the solid line positions as shown, thereby insuringthat both remotely operable, normally open, variable impedance devices76, 78--e.g., diodes D₁, D₂ --remain open and non-conductive. Thus,under these conditions, the repetitive series of fast rise timeelectromagnetic pulses are propagated down the coaxial cable 54 andtransmission line probe 52' without sensing any significant artificiallyinduced discontinuity at either point X₁ or X₂ ; and, therefore, suchpulses produce a series of reflections from such points as thecable/probe interface 54/52', the air/soil interface, and the ends ofconductors 62, 64, with a series of additional intermediate reflectionsgenerated by, for example, layer interfaces in layered soil and otherdielectric discontinuities in the medium under test, all of whichconstitute unwanted background noise. In short, waveform 75 depicted inFIG. 5 is typical of the type of waveform found by displaying allsignificant reflections generated as electromagnetic pulses arepropagated along a transmission line probe extending through soil orother medium to be investigated.

Referring to FIG. 5A, precisely the same waveform 75 is depicted at themoment that the switches S1, S2 are shifted to the dashed line positionsshown in FIG. 4, thereby biasing variable impedance device 76 (e.g.,diode D₁) to conduction to create a momentary short across probeconductors 62, 64; and, under these conditions, it will be observed thata large amplitude reflection is generated as indicated by the sharpnegative-going ramp 75a, producing a precise and accurate timing markerT₁ at the time of arrival of the reflection from the shorteddiscontinuity at point X₁ when variable impedance device 76 (diode D₁)is rendered conductive.

Referring next to FIG. 5B, the typical waveform 75 has been depicted atthe moment that switches S1, S2 are shifted to the dotted line positionsindicated in FIG. 4, thus rendering variable impedance device 78 (e.g.,diode D₂) momentarily conductive so as to create a momentary shortacross probe conductors 62, 64 at point X₂, again generating a largeamplitude reflection as indicated by the sharp negative-going ramp 75b,thereby producing a second precise and accurate timing marker T₂ at thetime of arrival of the reflection from the shorted discontinuity atpoint X₂ when variable impedance device 78 (e.g., diode D₂) is renderedconductive.

Using the electrical signaling processing capability incorporated in,for example, a conventional Tektronix Model 1502B TDR such as indicatedat 51 in FIG. 4, the shorted waveforms depicted in FIGS. 5A and 5B maybe readily subtracted from the open waveform shown in FIG. 5, therebyproducing the difference waveform shown in FIG. 6 represented by the twopositive-going ramps 90, 91, generating definitive, observable,measurable and accurate timing markers T₁, T₂ established at theintersections of the time axis and best fit straight lines drawn throughrespective ones of the positive-going ramps 90, 91. It will be observedupon comparison of FIG. 6 with each of FIGS. 5, 5A and 5B thatutilization of such a waveform subtraction process not only serves togenerate definitive, observable, measurable and accurate timing markersT₁, T₂, but, moreover, that process also serves to substantiallyeliminate all undesirable background noise reflections, thereby furtherenhancing the improved signal-to-noise ratio achievable with the presentinvention.

Those skilled in the art will, of course, appreciate that the particularsignal processing circuits employed in the conventional TDR unit 51shown in FIG. 4 form no part of the present invention, are completelyconventional, and need not be described herein in detail. Thoseinterested in acquiring a further explanation of the circuit details andoperation of, for example, a conventional Tektronix Model 1502 TDR unitare referred to Ref. No. 2 as well as to other technical papers andproduct specifications available from the manufacturer, Tektronix Corp.of Beaverton, Oreg. Moreover, it will be understood that commerciallyavailable and completely conventional TDR units can be employed otherthan the Tektronix Model 1502B TDR instrument.

As a consequence of the foregoing arrangement, it will be understoodthat n normally open variable impedance devices such as PIN diodes canbe fixedly mounted on the conductors of, for example, a 2-conductorprobe at fixed, known, precisely located points X_(n) (where n is anydesired whole integer) so as to enable each such device to beselectively and momentarily rendered conductive to short one probeconductor to the other at precise, accurately known points X_(n) ; and,to thereby create unambiguous, precise, accurate and readily observableand measurable timing markers T_(n) wherein all measurements of X₁, X₂ .. . X_(n) and T₁, T₂ . . . T_(n) are characterized by their accuracy. Asa consequence, the propagation velocity V of electromagnetic pulsestransiting the probe may be calculated to a high degree of accuracy bysolving for equation 1!, supra; and, thereby, the apparent dielectricconstant K_(a) of the particular material being tested can be readilycalculated by solving for K_(a) in equation 2!, supra, all as previouslydescribed.

While the present invention has hereinabove been described in connectionwith a TDR system 50' (FIG. 4) employing a conventional coaxial cable 54to interconnect the probe 52' and the conventional TDR instrument 51,those skilled in the art will appreciate that the particular type ofcable employed is not critical to the invention provided only that itpossesses suitable RF transmission characteristics. It is noted,however, that highly advantageous results have been achieved,particularly, but not exclusively, in situations requiring relativelylong interconnect transmission cables-e.g., cables ranging up to on theorder of one hundred meters in length--where the cable comprises a 75ohm RG-6 coaxial cable of the type designed for the cable televisionindustry. Such coaxial cable, which is available at low cost as comparedto other conventional RF transmission cables, has proven to provideexcellent performance characteristics notwithstanding its relatively lowcost--indeed, the performance characteristics observed have beensuperior to those obtained with more expensive cable.

In carrying out the present invention, it has been found that a widevariety of probe configurations are suitable dependent upon the specificapplication to which the probe is to be put. For example, referring toFIGS. 4 and 7 conjointly, it will be noted that the probe 52' (FIG. 4)and the probe 92 (FIG. 7) are both what have been termed in the art as"2-rod probes" or "2-wire probes"--i.e., probes having two (2) spaced,parallel, conductors. Such 2-rod or 2-wire probes are of the type whichhave been typically used in the prior art in combination with a baluntransformer in an attempt to minimize impedance mismatch problemsbetween the coaxial cable and the probe. Zegelin et al., Ref. No. 28;International Publication No. WO89/12820 based upon White et al.International Patent Application No. PCT/AU/89/00266.

It has been found, however, that when employing remotely operable,normally open, variable impedance devices--for example, a pair of PINdiodes D₁, D₂ --with otherwise conventional 2-rod or 2-wire probes,unambiguous, relatively large amplitude, and readily observable andmeasurable timing markers T₁, T₂ are generated. More specifically, suchtiming markers T₁, T₂ are characterized by their preciseness, accuracyand reliability, and permit determination of: i) the precise points X₁,X₂ . . . X_(n) where electrical discontinuities of interest occur alongthe probe; and ii), the precise times of arrival of reflections ofinterest T₁, T₂ . . . T_(n), all without the need to employ a baluntransformer or any other type of impedance matching transformer or thelike.

Comparing the probe 52' of FIG. 4 with the probe 92 depicted in FIG. 7,it will be observed that the two probes are essentially identical exceptthat in the probe 52', the diode D₁ is imbedded in the dielectricmaterial defining the base-like support 65 for the probe which isnormally located at, or very close to, the air/soil or otherair/material interface; whereas in the probe 92 shown in FIG. 7, thediode D₁ is positioned closer to the coaxial cable/probe interface54/92. It has been found, however, that any given diode D_(n) need notbe positioned precisely at a point X_(n) provided only that the timedelay difference for reflections generated at a specific point X_(n) andreflections generated at the actual position of the diode D_(n) issmall, constant and known. Thus, as shown in the exemplary arrangementdepicted in FIG. 7, it is possible to position the diode D₁ a shortdistance A from the desired location of X₁ at the air/soil interface;and, to then make a calibrating measurement to correct the time ofarrival T₁ for the reflection induced by forward biasing diode D₁ toconduction so as to compensate for the small, constant and knowndifferential distance A. This may be accomplished by simply placing ashorting bar (not shown) at location X₁, comparing the time delay readwith the shorting bar in place to the time delay read when diode D₁ isconductive, and adjusting the T₁ timing marker for the small timedifference calculated.

Referring to FIG. 8, a modified probe 94 also embodying features of theinvention has been illustrated--such probe 94 here comprising a 3-rodprobe of the type described by Zegelin et al., Ref. No. 28, and inInternational Publication No. WO89/12820 based upon White et al.International Patent Application No. PCT/AU89/00266, which 3-rod probeserves to more closely emulate the impedance characteristics of atypical coaxial cable. As here shown, probe 94 includes a dielectricbase member 65, a central probe conductor 95 coupled to the centralconductor 66 of the coaxial cable 54, and a pair of outer probeconductors 96, 98 which are disposed on opposite sides of the centralprobe conductor 95 and are parallel thereto, with such outer probeconductors 96, 98 being coupled to the coaxial cable shield 68. In thisinstance, however, three (3) variable impedance devices areemployed--viz., i) one variable impedance device which here takes theform of a normally open PIN diode D₁ serving to couple the centralconductor 66 of the coaxial cable 54 to the coaxial shield 68 adjacentthe cable/probe interface 54/94 and, therefore, which is in closeproximity to the air/soil interface (not shown); and ii), a pair ofnormally open PIN diodes D₂, D₂ ' respectively coupling the distal endsof the outer probe conductors 96, 98 to the distal end of the centralprobe conductor 95.

Thus, the arrangement is such that when probe 94 (FIG. 8) is substitutedfor probe 52' in FIG. 4, all diodes D₁, D₂, D₂ ' remain open andnon-conductive when the switches S1, S2 are in the solid line positionsshown in FIG. 4. However, when the switches S1, S2 are shifted to thedashed line positions shown in FIG. 4, a positive bias voltage isapplied to the central probe conductor 95 via series resistors R1, R2and the central conductor 66 of the coaxial cable 54, thereby forwardbiasing diode D₁ to conduction to create a momentary short adjacent theair/media interface and generating a first timing marker T₁. When theswitches S1, S2 are shifted to the dotted line positions shown in FIG.4, a positive biasing voltage is then applied to the outer probeconductors 96, 98 via the coaxial cable shield 68, forward biasing thediodes D₂, D₂ ' to conduction and shorting the outer probe conductors96, 98 to the central probe conductor 95 at point X₂ adjacent the probeconductor distal ends, thereby generating a second timing marker T₂ inthe manner previously described.

When dealing with certain test media where the material to be tested isrelatively homogeneous--for example, measurements of soil water contentin seedling nurseries and the like--it has been found that the naturalreflection T₂ from the transmission line end is typically large and freeof distortion even in the absence of a passive or active physical devicefor establishing a shorted electrical discontinuity at or adjacent theprobe's distal end; and, consequently, where 2-rod or 3-rod probes ofthe type depicted in FIGS. 7 and 8 are employed, the use of a variableimpedance device at or adjacent the distal probe end is not necessary inpractice since the natural reflection from the probe's distal end canprovide an unambiguous, detectable and measurable reflectionestablishing the timing marker T₂. Therefore, 2-rod or 3-rod probesemploying only a single variable impedance device--e.g., a single diodeD₁ --capable of generating a timing marker T₁ at a position adjacent theair/media interface have been found to be completely satisfactory andacceptable for use in such homogeneous test media. Examples of such2-rod and 3-rod probes employing only a single PIN diode D₁ have beenillustrated in FIGS. 9 (a 2-rod probe 92') and 10 (a 3-rod probe 94').It will be understood that when using probes such as depicted at 92',94' in FIGS. 9 and 10, rendering the diode D₁ momentarily conductiveserves to generate a first unambiguous reflection defining timing markerT₁, while the second timing marker T₂ is generated by the naturalreflection from the probe's distal end.

Turning next to FIGS. 11 and 12, there has been illustrated a modified2-rod probe embodying features of the present invention, here generallyindicated at 99, which here takes the form of a unitary, integral,imperforate, blade-like, bayonet-type probe that might also be termed a"stripline" probe. As here shown, the probe 99 comprises a pair ofelongate flat conductors 100, 101 having rectangular cross sections asshown in FIG. 12, with the two conductors 100, 101 being spaced apartby, and integrally bonded to, an interior or central non-conductivedielectric spacer 102. Oppositely directed, normally open, remotelyoperable PIN diodes D₁, D₂ or other suitable variable impedance devicesare imbedded in the dielectric spacer 102 adjacent the opposite ends ofthe probe 99 at respective ones of points X₁, X₂, with each diode beingelectrically coupled to the conductors 100, 101.

In the exemplary probe 99 illustrated in FIG. 11, the distal ends of theconductors 100, 101 and the intermediate dielectric spacer 102 areshaped to define a pointed probe end, as indicated at 104, so as toallow the probe 99 to be easily inserted into the soil or other testmedium without significant disturbance thereof. While the bayonet-typeprobe 99 depicted in FIGS. 11 and 12 employs conductive rods 100, 101formed of flat, bar-like, stainless steel stock of rectangular crosssection, the conductors can have other configurations including, merelyby way of example, oval, round, knife-edged, channel-shaped, or thelike; but, since the conductors are preferably formed of stainless steelwhich is difficult to work, it has been found effective when theconductors are simply formed of flat, bar-like stock as shown.

In carrying out the present invention, the non-conductive dielectricmaterial used to form, for example, the dielectric spacer 102 of thebayonet-type stripline probe 99 depicted in FIGS. 11 and 12 (or theprobe base supports 65 for the probes depicted in FIGS. 4 and 7 through10), is preferably selected for its ease of workability, impactresistance, durability, non-conductive characteristics, sealabilityand/or security of encapsulated electric components such as PIN diodes,and its low shrink characteristics during cure. While a wide range ofdielectric epoxy materials are suitable for this purpose, excellentresults have been achieved using SEALTRONIC (a trademark of IndustrialFormulators of Canada Ltd.) resin epoxy encapsulate, Product No. 21AC-7Vavailable from Industrial Formulatots of Canada Ltd. in Burnaby, BritishColumbia, Canada. This particular epoxy material comprises a two-partliquid potting compound developed for the electronics industryconsisting of a liquid resin and a liquid hardener. When the resin andhardener are thoroughly mixed in proportions of two parts resin to onepart hardener, the resulting mixed liquid epoxy remains pourable andworkable for approximately sixty (60) minutes at 20° C. (68° F.). Thecure time for this epoxy material is approximately forty-eight (48)hours at 20° C. (68° F.) or approximately one (1) hour at 65° C. (150°F.); and, the resulting cured dielectric epoxy material comprises anon-porous, water and chemical resistant, and extremely impact resistantmaterial that exhibits shrinkage of less than 0.5% during cure which hasbeen found to be particularly suitable for use with the presentinvention.

Unfortunately, however, in those instances where the probe conductorsare formed of stainless steel--for example, as are the exemplaryconductors 100, 101 of the bayonet-type probe 99 depicted in FIGS. 11and 12--it has been found difficult to achieve an adequate and enduringbond between the stainless steel conductors 100, 101 on the one hand andthe dielectric spacer 102 on the other. This problem may, however, bereadily resolved by employing bonding techniques similar to thoseillustrated diagrammatically in: i) FIGS. 13-17; and ii), FIG. 18.

Thus, in keeping with this aspect of the invention, a flexible,elongate, wire 105 formed of stainless steel or similar weldableconductive material is formed into a generally sinuous configuration andbonded to the inner facing surfaces 106, 108 of each of the stainlesssteel conductors 100, 101, for example, by welding at points 109 to formfacing integral, unitary, conductor/wire assemblies 100/105, 101/105wherein each wire 105 is spaced from the conductors 100, 101 to which itis welded at spaced points along the length thereof. Two pairs ofconnector pins or tabs 110 are then welded adjacent one end of each tabto the inwardly facing surfaces 106, 108 of the probe conductors 100,101 adjacent the opposite ends of the probe 99. The free ends of eachpair of tabs 110 are then soldered to the leads of respective ones of apair of oppositely directed diodes D₁, D₂ (FIGS. 16, 17) which aremounted on respective ones of a pair of small circuit boards 111 whichare inserted between the probe conductors 100, 101 adjacent the oppositeends thereof.

At this point, the assembly thus far formed consisting of: i) the spacedstainless steel conductors 100, 101; ii) the sinuous wires 105 welded tothe inner facing surfaces 106, 108 thereof; and iii), the printedcircuit boards 111 bearing thereon PIN diodes D₁, D₂ and having theirconnector pins or tabs 110 welded to the stainless steel conductors 100,101 adjacent the opposite ends thereof; are placed in a suitable mold(not shown) which defines the ultimate desired shape of the probe such,for example, as the bayonet-like shape depicted in FIGS. 11 and 13. Theliquid epoxy material consisting of the thoroughly mixed resin andhardener is then poured into the mold in liquid form where it completelyfills the cavity defined by the two spaced apart stainless steelconductors 100, 101 and totally surrounds the sinuous wires 105 andcircuit boards 111 upon which the diodes D₁, D₂ are mounted.Consequently, when the epoxy material has been fully cured, theresulting probe comprises a unitary, integral, imperforate probe 99consisting of: i) spaced conductors 100, 101; ii) an intermediatedielectric spacer 102 which is securely bonded in place by virtue of theimbedded wires 105 which are welded to the inner faces 106, 108 of theconductors; and iii), diodes D₁, D₂ which are totally imbedded in thecured dielectric material and protected thereby, while at the same time,they are electrically coupled to the conductors 100, 101 by virtue ofthe connector pins or tabs 110 which are welded at 112 directly to theconductors.

Turning now to FIG. 18, a slightly modified technique for establishing asecure and enduring bond between spaced stainless steel conductors 100,101 and an intermediate dielectric spacer 102 has been illustrated.Thus, in this arrangement, V-shaped saw cuts 114 or the like are formedat spaced points along the inwardly facing surfaces 106, 108 of theconductors 100, 101. Consequently, when the assembly--including circuitboards and diodes (not shown in FIG. 18) similar to those depicted inFIGS. 13, 16 and 17--is placed in a suitable mold (not shown) and theliquid epoxy material is poured into the cavity between the conductors100, 101, the liquid epoxy fills the V-shaped saw cuts 114 so that uponcuring, the unitary, solidified, epoxy material defining the dielectricspacer 102 extends laterally into the saw cuts 114 and serves to preventseparation of the conductors 100, 101 from the dielectric spacer 102.

Those skilled in the art will, of course, appreciate that thearrangement depicted in FIG. 18 will provide an improved, more enduringbond between the conductors 100, 101 and the dielectric spacer 102resisting separation of the components in the plane of the probe; but,such arrangement will not provide significant enhancement of the bondwhen impacts or other forces are exerted normal to, or at an angle to,the plane of the probe. Where this presents a problem, the inwardlyfacing surfaces 106, 108 of the conductors can also be provided witheither continuous or discontinuous longitudinal grooves (not shown) sothat when the liquid epoxy is poured into the cavity between theconductors 100, 101, such grooves will be filled with epoxy which, whencured and hardened, will form a tongue-and-groove joint (not shown)providing strength and an enhanced bond resisting impacts and otherforces tending to separate the parts and which may be applied eithernormal to, or at an angle to, the plane of the probe.

It will, of course, be recognized by those skilled in the art that otherstructures can be designed and/or fabricated to achieve essentially thesame results. For example, although not shown in the drawings, the probeconductors 100, 101, which are here shown formed from stainless steelbar stock of rectangular cross-section, could each bechannel-shaped--e.g., a conductor having a C-shaped cross-section--witha C-shaped wire screen or the like welded across the open faces of theC-shaped channel.

In accordance with another of the important aspects of the presentinvention, provision is made for enabling simple conversion ofconventional 2-rod probes of the type illustrated at 52 in FIGS. 11 and19 to generally thin, flat, bayonet-type, stripline probes embodyingfeatures of the present invention wherein n active, normally open,remotely operable, variable impedance devices are incorporated in theprobe so as to permit selectively rendering such n device(s) momentarilyconductive to short the probe conductors at n point(s) X_(n) (where n isany desired whole integer), thereby enabling generation of precise,accurate and unambiguous reflections of relatively large amplitude whichare readily observable, detectable and measurable to define accuratetiming markers T_(n). To accomplish this, and as best shown by referenceto, for example, FIGS. 19 through 23 conjointly, the present inventionprovides for the use of a sheath-like adaptor, generally indicated at115 in FIG. 20, which can be easily slid onto a conventional 2-rodprobe--such, for example, as the conventional probe 52 depicted in FIGS.1 and 19--so as to convert such conventional probe 52 into a relativelythin, flat, bayonet-type, stripline probe embodying features of thepresent invention.

Thus, referring first to FIG. 19, it will be noted that the conventionalprior art probe 52 there illustrated is identical to the conventionalprior art probe 52 shown in FIG. 1, having a pair of spaced, parallel,rod-like conductors 62, 64 formed of stainless steel or the like whichare secured at one end to a dielectric support base 65. In other words,the probe 52 is similar to conventional 2-rod or 2-wire probes of thetype described in Zegelin et al., Ref. No. 28, and in InternationalPublication No. WO89/12820 based upon White et al. International PatentApplication No. PCT/AU89/00266.

The sleeve-like adaptor 115, in turn, comprises an assembly including apair of identical tubular conductors 116R, 116L formed of stainlesssteel or the like. Each such tubular conductor is, preferably, ofgenerally d-shaped cross section, having a cylindrical or tubularportion 118R, 118L complemental in shape to the cross-sectional shape ofthe probe conductors 62, 64 and terminating in integral tangentialflanges 119R, 119L, as best shown by reference to FIGS. 21 through 23.The inside diameters of the tubular portions 118R, 118L of the tubularconductors 116R, 116L are dimensioned such that the pair of tubularconductors 116R, 116L will slide over and accommodate respective ones ofthe rod-like conductors 62, 64 on the conventional 2-rod probe 52 (FIG.19) with a snug fit providing good electrical contact therebetween.

As best shown in FIGS. 22 and 23, a pair of active, remotely operable,normally open, variable impedance devices such, for example, as normallyopen diodes D₁, D₂ mounted on small circuit boards 120, are,respectively, electrically coupled adjacent the opposite longitudinalends of the two flanges 119R, 119L which are oriented such that flange119R defines the upper right half of the surface of the adaptor 115 asviewed in the drawings, while flange 119L defines the lower left half ofthe surface of the adaptor 115, with the two flanges lying in parallelplanes and extending towards a vertical plane extending through thelongitudinal centerline of the adaptor 115. The longitudinal axes of thetubular portions 118R, 118L are spaced apart and parallel; and, lie onaxes coincident with the axes of the parallel conductors 62, 64 of theprobe 52 when the adaptor 115 and probe 52 are assembled.

In assembly of the adaptor 115, the tubular conductors 116R, 116L arepositioned in any suitable jig-like mold (not shown); the diodes D₁, D₂on the respective circuit boards 120 are properly positioned andsoldered to connector pins or tabs 121, 122 respectively welded to theflanges 119R, 119L; and, the remaining cavity therebetween is thenfilled with a liquid 2-component epoxy material which, when cured,defines a hard, durable, impact resistant dielectric spacer 124 betweenthe tubular conductors 116R, 116L terminating at its distal end in arelatively sharp point 125 to facilitate insertion of the probe/adaptorcombination 52/115 into the test medium without undue disturbancethereof. In this arrangement, the dielectric spacer 124 serves toencapsulate, and thus protect, the diodes D₁, D₂. Although not shown inthe drawings, those skilled in the art will appreciate that where thetubular conductors 116R, 116L are formed of stainless steel or the like,the dielectric spacer 124 can be formed from the same epoxy material aspreviously described to form the spacer 102 on the probe 99 depicted inFIGS. 11 and 12. Moreover, the same type of bonding techniques aspreviously described in connection with FIGS. 13 through 18 can beemployed when assembling the sheath-like adaptor 115 in a suitable jig.

Thus, the arrangement is such that the assembled sheath-like adaptor 115can be readily slipped on, or removed from, the rod-like conductors 62,64 of an otherwise completely conventional 2-rod probe such as indicatedat 52 in FIG. 19. When slipped on the conductors 62, 64, tubularconductor 116R telescopically receives and houses probe conductor 62 inintimate electrical contact therewith; tubular conductor 116Ltelescopically receives and houses probe conductor 64 in intimateelectrical contact therewith; and, diodes D₁, D₂ define oppositelydirected, normally open, remotely operable, active, variable impedancedevices adjacent respective ones of the opposite longitudinal ends ofthe adaptor 115 and, therefore, adjacent opposite ends of the probe 52assembled therewith. If desired, suitable conductive set screws or thelike (not shown) can be employed to lock the adaptor 115 in place withrespect to the probe conductors 62, 64, while, at the same time,insuring good electrical contact between the tubular conductors 116R,116L and respective ones of the probe conductors 62, 64.

In usage of TDR systems employing sheath-like probe adaptors of theforegoing type, it is merely necessary to place the adaptor 115 on theconventional 2-rod probe 52 and provide a bias insertion network such asindicated at 79 in FIG. 4 capable of selectively and sequentiallybiasing the diodes D₁, D₂ to momentary conduction. Thus, the system canbe operated in the manner previously described in connection with FIG.4, but using a completely conventional 2-rod probe 52 in combinationwith the adaptor 115 which serves to convert the conventional 2-rodprobe to a relatively thin, flat, bayonet-type, stripline probeembodying features of the present invention.

In further keeping with the foregoing aspects of the present invention,provision is also made for converting a completely conventional priorart 3-rod probe--for example, a probe of the type described anddeveloped by Zegelin et al., Ref. No. 28; and, also described inInternational Publication No. WO89/12820 based upon White et al.International Patent Application No. PCT/AU89/00266 such as the probe 69depicted in FIGS. 2 and 24--into a relatively thin, flat, bayonet-type,stripline probe embodying features of the present invention. To thisend, a modified sheath-like adaptor, generally indicated at 126 in FIGS.25, 26 and 27, is provided for usage with a conventional 3-rod probe 69(FIGS. 2 and 24) having three (3) spaced parallel conductors--viz., acentral conductor 70 and a pair of parallel outer conductors 71,72--secured to a dielectric support base 65.

Thus, as will be best appreciated by reference to FIGS. 25, 26 and 27conjointly, it will be observed that the modified sheath-like adaptor126 includes three (3) spaced parallel conductors 128, 129, 130 disposedon parallel longitudinal axes having the same spacing as the parallellongitudinal axes for the conductors 70, 71, 72 of probe 69 (FIG. 24).In the exemplary device, conductor 128 includes a tubular portion 131and a tangential flange 132 having right and left flange portions 132R,132L adapted to lie along the lower surface of the adaptor 126 as viewedin FIGS. 26 and 27. Conductor 129 has a generally d-shaped cross-sectiondefined by a tubular portion 134 and a tangential flange 135 adapted tolie along the upper right longitudinal surface of the adaptor 126 asviewed in FIGS. 26 and 27 in a plane parallel to, and spaced from, theflange 132R on the central tubular conductor 128; while conductor 130 issimilarly shaped having a tubular portion 136 and a tangential flange138 lying along the upper left longitudinal surface of the adaptor 126as viewed in FIGS. 26 and 27 in a plane parallel to, and spaced from,the flange 132L on the central tubular conductor 128.

In this arrangement, a pair of normally open, remotely operable,variable impedance devices such as oppositely directed diodes D₁, D₂(FIGS. 26 and 27) mounted on small circuit boards 120 are electricallyconnected adjacent opposite longitudinal ends of the conductors 128, 130to the left flange 132L on the central tubular conductor 128 and theflange 138 on the left tubular conductor 130. Such electrical connectionincludes connector pins or tabs 139 welded at one end of each tab to theconductor flanges 132L, 138 adjacent opposite ends thereof; with theopposite ends of the tabs 139 then being soldered to respective ones ofthe diodes D₁, D₂ on circuit boards 120. In like manner, a second pairof oppositely directed diodes D₁ ', D₂ ' (FIGS. 26 and 27) mounted onsmall circuit boards 120 are electrically connected adjacent oppositelongitudinal ends of the tubular conductors 128, 129 to the right flange132R on the central tubular conductor 128 and the flange 135 on theright tubular conductor 129.

Once the tubular conductors 128, 129, 130 have been placed in a jig-likemold (not shown) and oriented in the relative positions depicted inFIGS. 26 and 27: i) the connector pins or tabs 139 are welded to theconductor flanges 132L, 132R, 135, 138; and ii), the diode pairs D₁, D₂and D₁ ', D₂ ' mounted on the small circuit boards 120 are properlypositioned and the leads on diodes D₁, D₂ and D₁ ', D₂ ' are soldered tothe free ends of the tabs 139 so as to electrically couple the diodepairs D₁, D₂ and D₁ ', D₂ ' across the respective flange pairs 132L, 138and 132R, 135. Thereafter, the two-part liquid epoxy material previouslydescribed is poured into the cavity defined between the tubularconductors 128, 129 and 128, 130 to form, after curing, a hardened,impact resistant, dielectric spacer 140 having a pointed distal end 141(FIG. 25) formed of dielectric material to facilitate insertion intosoil and similar test media.

Consequently, upon assembly of the relatively thin, flat, bayonet-type,stripline, sheath-like adaptor 126 depicted in FIGS. 25 through 27 onthe conventional 3-rod probe 69 depicted in FIG. 24, the diodes D₁, D₁ 'serve as remotely operable, normally open, active, shorting devices formomentarily shorting the central telescoped conductors 70/128 to theouter telescoped conductors 71/129 and 72/130 adjacent the air/mediainterface (not shown) so as to generate a first reflection from thatshorted discontinuity which serves to establish a first definitive,accurate, and unambiguous timing marker T₁ at a fixed, precise and knownpoint. Similarly, the diodes D₂, D₂ ' serve as remotely operable,normally open, active, shorting devices for momentarily shorting theouter telescoped conductors 71/129 and 72/130 to the central telescopedconductor 70/128 adjacent the distal ends of the probe conductors 70,71, 72 so as to generate a reflection from a second known precise pointspaced longitudinally from the diodes D₁, D₁ ' by a fixed knowndistance, thereby establishing a second precise and accurate timingmarker T₂.

As in the case of the adaptor 115 previously described in connectionwith FIGS. 20-23, when using the adaptor 126 depicted in FIGS. 25-27,the overall TDR system will include a bias insertion network, such asthat indicated at 79 previously described in connection with FIG. 4,which is interposed in the coaxial cable 54 for selectively andsequentially rendering diode pairs D₁, D₁ ' and D₂, D₂ ' momentarilyconductive during operation of the system so as to generate first andsecond relatively large amplitude, unambiguous reflections respectivelyestablishing first and second precise and accurate timing markers T₁,T₂. And, once again, although not shown in the drawings, one or moreconductive set screws can be employed to positively clamp the adaptor126 to the probe conductors 70, 71, 72 while at the same time insuringthat there is a sound electrical connection therebetween.

Although not shown in the drawings, those skilled in the art willappreciate from the foregoing description that the adaptorconfigurations 115 and 126 shown by way of example in FIGS. 20 and 25,respectively, which enable conversion of conventional probes into probesembodying features of the invention, also define, in their own right,integral 2-conductor (FIG. 20) and 3-conductor (FIG. 25) striplineprobes which can be coupled directly to a suitable RF cableinterconnecting the probe to a TDR apparatus. Moreover, although notshown in FIG. 25, the distal ends of conductors 129, 130 can, wheredesired, be integral with a solid stainless steel probe end which isspaced from the central conductor 128 by dielectric material 140.

Turning next to FIGS. 28 and 29, yet another modified adaptor, generallyindicated at 142, embodying features of the present invention has beenillustrated. As here shown, the adaptor 142 is designed to be slid onthe spaced, parallel, rod-like conductors 144, 145 of a conventional2-rod or 2-wire probe; but, those skilled in the art will appreciate asthe ensuing description proceeds that the adaptor 142 can, if desired,be designed and configured so as to be usable with 3-rod or 3-wireprobes in a manner consistent with that described above for the adaptor126 depicted in FIGS. 25 through 27.

More specifically, the adaptor 142 depicted in FIGS. 28 and 29comprises: i) a relatively short, thin, flat, bayonet-type device whichis not co-extensive in length with the length of the probe conductors144, 145 as were the adaptors 115 (FIG. 20) and 126 (FIG. 25) previouslydescribed; but, rather, where the adaptor 142 comprises a relativelyshort assembly including a pair of spaced, parallel conductors 146, 148each having a generally d-shaped cross-sectional configuration, bestshown in FIG. 29, defining tubular portions 149, 150 and tangentialflanges 151, 152; ii) a central dielectric spacer 154; and iii), asingle diode D_(n) mounted on a small circuit board 120 wherein thediode D_(n) is coupled across the tubular conductor flanges 151, 152 bymeans of connector pins or tabs 155 welded to the flanges 151, 152 andthereafter soldered to the leads on the diode D_(n), with the diodebeing imbedded in the dielectric spacer 154 so as to permit shorting ofthe telescoped conductors 144/146 to the telescoped conductors 145/148at such time as the diode D_(n) is momentarily biased into conduction bya suitable bias insertion network such as that shown at 79 in FIG. 4. Asbest illustrated in FIG. 28, it will be noted that the tubularconductors 146, 148 and their respective flanges 151, 152, as well asthe dielectric spacer 154, are shaped to form a sharp pointed end 156 soas to facilitate insertion of the adaptor 142 into soil or other porousmedia without undue disturbance. Of course, it will be evident that theadaptor 142 depicted in FIGS. 28 and 29 can be assembled in essentiallythe same fashion as previously described for the adaptors 115 (FIG. 20)and 126 (FIG. 25).

In usage, the adaptor 142 is slid onto the probe conductors 144, 145which are telescopically received within the tubular conductor portions149, 150 in snug fitting interrelationship therewith defining goodelectrical contact. The adaptor may be positioned adjacent the distalends of the probe conductors 144, 145 to provide a remotely operable,shortable electrical discontinuity adjacent the terminus of the probe;or, it may be shifted along the probe conductors 144, 145 until it islocated adjacent the air/media or coaxial cable/probe interface toprovide a remotely operable, shortable electrical discontinuity at thatpoint; or, it may be positioned at any desired location along thelengths of the probe conductors 144, 145 so as to vary the effectivelength of the probe; or, two such adaptors 142 respectively havingoppositely directed diodes D₁, D₂ (not shown) may be mounted on theprobe conductors 144, 145 at two longitudinally spaced points, therebyconverting a conventional 2-rod probe of fixed length to a 2-diode,2-rod probe of any desired effective length. In any of the foregoingarrangements, the adaptor(s) is(are) preferably tightly clamped to theprobe conductors 144, 145 at the desired location(s) by any suitableconductive set screws 158, 159 (FIG. 28) which serve not only to clampthe adaptor(s) in the desired location(s) but, additionally, to insurethat sound electrical contacts are established therebetween.

Turning next to FIG. 30, the present invention has been illustrated asit might be incorporated for determining the average moisture level in atypical seedling nursery, generally indicated at 160. Thus, as hereshown a plurality of seedlings 161 are depicted as having been plantedin soil or other suitable planting mix 162 disposed in a plurality ofclosely spaced, discrete, wedge-shaped planting cavities 164 formed in aStyrofoam block 165. More specifically, although not shown in detail inthe drawings, those skilled in the art of reforestation will appreciatethat seedling nurseries will commonly employ a plurality of Styrofoamblocks 165 of the type shown in FIG. 30 wherein each block may have aplurality of wedge-shaped planting cavities 164 formed therein in arectilinear array of, merely by way of example, ten (10) X-oriented rowsand ten (10) Y-oriented columns defining a total of one hundred (100)closely adjacent planting cavities 164. The particular number ofplanting cavities formed in any given Styrofoam block 165 is, of course,not critical and will vary widely from seedling nursery to seedlingnursery. Commonly, a plurality of such Styrofoam blocks 165 will besupported on tables in a greenhouse or other climate controlled seedlingnursery facility.

Prior to the advent of the present invention, the typical way employedto determine the average moisture content of the plurality of discretebatches of planting mix 162 in the plurality of planting cavities 164formed in any given Styrofoam block 165 was to remove the block andweigh it so as to enable comparison of the weight of the block to thenormal weight of a block containing planting mix having a desiredaverage moisture level. This common practice is not only time consumingand labor intensive, but, moreover, is often ineffective, particularlywhere the nursery may have tightly packed groups of such blocks 165where the centermost blocks are not adjacent to the aisle and are notconveniently accessible to the workmen. The present invention overcomesthis disadvantage by providing a plurality of moisture sensitive probesdisposed in a series arrangement defining a series averaging probe,generally indicated at 166, which can be readily configured to permitdetermination of the average moisture of the planting mix 162 disposed,for example, in: i) an entire row of planting cavities 164; or ii),multiple adjacent or spaced rows of planting cavities 164; or iii), evenall or any selected sampling of all planting cavities 164 disposed inany given block 165 or group of blocks 165.

In keeping with this aspect of the present invention, the exemplaryseries averaging probe 166 comprises a plurality of spaced 2-rod or3-rod probes 168₁, 168₂, 168₃ . . . 168_(m) (where m is any wholeinteger greater than one). Typically the 2-rod or 3-rod probes 168_(m)(of which only one rod or conductor is visible in FIG. 30) may be formedof 0.09375" (3/32") diameter stainless steel welding rods or the likeeach having a length slightly greater than the depth of each plantingcavity 164 so as to enable each probe 168_(m) to pass diagonally throughthe soil or other suitable planting mix 162 disposed in each plantingcavity 164 with the probe conductors extending slightly above one sideof the top of the cavity 164 and slightly below the opposite side of thebottom of the cavity 164.

In order to couple the plurality of probes 168₁, 168₂ . . . 168_(m)together to form a series averaging probe 166, a plurality of flexiblebottom and top couplers, generally indicated at 169, 170, are providedeach including an outer flexible tubular insulator 171, an inner shortlength of RF transmission line 172, and a pair of internal couplers 174at each end of the transmission line 172 and permanently affixed withineach end of the flexible tubular members 171 in moisture-tight sealingrelation therewith. Thus, the arrangement is such that the coupler 174at each end of a transmission line 172 can be slidably engaged with theprojecting ends of two adjacent probes-for example, one flexible bottomcoupler 169 can be slidably engaged with the outwardly projecting bottomends of the probes 168₁, 168₂ ; one flexible top coupler 170 can beslidably engaged with the outwardly projecting upper ends of the probes168₂, 168₃ ; etc., to form a series averaging probe 166 consisting ofspaced 2-rod or 3-rod probes 168₁, 168₂ . . . 168_(m) interconnected byshort lengths of insulated RF transmission line 172. Although not shownin FIG. 30, those skilled in the art will appreciate that the bottom andtop couplers 169, 170 may be secured to the outwardly projecting ends ofthe probes 168₁, 168₂ . . . 168_(m) in any suitable manner--for example,by set screws, clamps or the like.

In order to complete the series averaging probe 166, the probe at oneend-for example, probe 168₁ --has the upper end of the probe conductorsmounted in a suitable dielectric support base 175 within which isimbedded a first remotely operable, normally open, active, variableimpedance device such as a PIN diode D1 (not shown in FIG. 30, butessentially the same as the arrangement illustrated for diode D₁ in FIG.4) with the upper end of the conductors for the probe 168₁ beingelectrically coupled to a coaxial cable 54 in the manner previouslydescribed.

Similarly, a spade-like fitting, generally indicated at 142, which maybe identical to that described in connection with FIGS. 28 and 29, maybe slidably mounted over the upper free ends of the conductors definingthe last of the series arranged moisture sensitive probes 168_(m) so asto electrically couple a second oppositely directed, remotely operated,normally open, active, variable impedance device such as a PIN diodeD_(n) (not shown in FIG. 30, but essentially identical to thearrangement shown in FIG. 29) at the distal end of the series averagingprobe 166.

As a consequence of this arrangement, the nursery operator need onlycouple each series averaging probe 166 in the greenhouse or othernursery facility to a TDR instrument such as that shown in FIG. 4 at 51using a suitable bias insertion network 79 and a conventionalmultiplexing arrangement of, for example, the type described in Baker etal., Ref. No. 3. Since the intermediate transmission lines 172 are ofshort constant known length and maintained free of moisture by theinsulator 171 and end couplers 174, they will contribute a knownconstant delay in determination of the timing marker T₂ generated byreflections from the momentarily shorted diode D_(n) in the spade-likefitting 142 at the distal end of the series averaging probe 166.Therefore, measurement of the propagation velocity of electromagneticpulses transmitted down the series averaging probe 166 will enablecalculation of the average apparent dielectric constant K_(a) for all ofthe discrete batches of soil or other planting mix 162 disposed withinthose wedge-shaped cavities 164 through which the series averaging probe166 extends.

Indeed, this arrangement readily permits reliable and accuratemeasurements of average moisture content of the soil or other plantingmix 162 disposed in those wedge-shaped cavities 164 that are remote fromthe aisle and normally inaccessible to nursery workmen. For example, inthose instances where Styrofoam blocks 165 containing one or more seriesaveraging probes 166 are located immediately adjacent the aisles throughwhich nursery workmen can move, it is merely necessary to insure thatthe proximate end of each probe 166 containing the diode D₁ imbedded inor adjacent to the dielectric support member 175 is oriented at the edgeof the Styrofoam block 165 immediately adjacent and parallel to theaisle.

On the other hand, where one or more series averaging probes 166 arelocated in a Styrofoam block or blocks 165 remote from an aisle--e.g.,in an arrangement where the nursery includes a 10×10 array of Styrofoamblocks 165 bordered by access aisles, only the peripheral thirty-six(36) blocks 165 will be immediately adjacent an access aisle, while theinterior sixty-four (64) Styrofoam blocks 165 disposed in an internal8×8 array will be remote from an access aisle and, therefore, they willbe progressively more inaccessible to workmen for purposes of moisturemeasurements--it is merely necessary to run short lengths oftransmission line 54 from each such less accessible series averagingprobe 166 to the nearest access aisle at the time that the Styrofoamblocks 165 with their newly planted seedlings are initially positionedon the support table, platform, or other nursery work surface (notshown), thereby enabling a workman to mount the TDR instrument and biasinsertion network such as respectively shown at 51 and 79 in FIG. 4 on aportable dolly which can then be moved through the aisle to permitsuccessive coupling of the measurement equipment to all or any selectedsampling of the multiplicity of series averaging probes 166 and/or theshort transmission lines 54 coupled thereto. Alternatively, and aspreviously described above, the multiplicity of series averaging probes166 can, irrespective of whether they are adjacent to or remote from anaccess aisle, be coupled through a completely conventional multiplexingsystem to a fixed or stationary TDR instrument 54 and bias insertionnetwork 79 via RF transmission lines 54 of fixed and known lengths.

In accordance with another of the important aspects of the presentinvention, and as will be best understood by reference to the ensuingdescription in connection with FIGS. 31 through 34, there has beenillustrated a modified, but exemplary, form of electronic TDR apparatus,generally indicated at 180 in FIG. 31, embodying features of the presentinvention and here employing: i) a Diode Control Section, generallyindicated at 181, for enabling repeated switching of either diode D₁ orD₂ in a two-diode bayonet-like probe--e.g., a probe such as thatindicated at 99 in FIGS. 11, 12 and 31--between open and shorted states;ii) an RF Section, generally indicated at 182, containing a PulseGenerator 184, a Sample-And-Hold circuit 185, and Variable Delaycircuitry 186; and iii), a low frequency Synchronous Detection Section,generally indicated at 188, comprising a signal processing circuitcontaining: a) a Repetition Rate Generator 189; b) an AC Amplifier 190,Filter 191, AC Amplifier 192, Analog Multiplier 194 and Low Pass Filter195 connected in series and receiving signals output from theSample-And-Hold circuit 185 in the RF section 182; and c), a Delaycircuit 196 and an AC coupled Buffer Amplifier 198 for coupling squarewave output pulses from the Diode Control Section 181 to the AnalogMultiplier 194 in a manner described hereinbelow with moreparticularity.

It should be noted that the circuits within each of the blocksdiagrammatically illustrated in FIG. 31--viz., block 184 (PulseGenerator), block 185 (Sample-And-Hold circuit), block 186 (VariableDelay circuitry), block 189 (Repetition Rate Generator), blocks 190 and192 (AC Amplifiers), block 191 (Filter), block 194 (Analog Multiplier),block 195 (Low Pass Filter), block 196 (Delay circuit) and block 198 (ACBuffer Amplifier)-are completely conventional and may vary widely asmatters of choice and circuit design dependent upon the particulardesigner and the specific applications involved and/or results desired.Consequently, the specific circuit details employed in each of suchblock components need not be, and are not, described herein in detail.

In the exemplary circuitry depicted in FIG. 31, the signal processingcircuitry defining the Synchronous Detection Section 188 permits directdetection of the difference in amplitude of the output from theSample-And-Hold circuit 185 arising from the diode-open reflection attime T and the amplitude of the output from the Sample-And-Hold circuit185 arising from the diode-shorted reflection at time T, with the entireTDR apparatus 180 permitting the direct measurement of a differencefunction similar to that shown in FIG. 6. A Delay Modulation input 199to the Variable Delay circuitry 186 in the RF Section 182--i.e., inputcircuitry (not shown) for rapidly and alternately switching the VariableDelay circuitry 186 between a first time delay T_(A) and a second Tdelay T_(B) --permits waveform differentiation by modulating the timedelay in synchronism with the TDR repetition rate established by theRepetition Rate Generator 189 so as to allow a single modifiedelectronic TDR apparatus 180 embodying features of the present inventionto detect passive as well as active timing markers.

In carrying out this aspect of the invention, and as will be bestunderstood by reference to FIGS. 31 and 32 conjointly, provision is madefor selectively switching the diodes D₁, D₂ in the probe 99 (FIG. 31)between the open and shorted states. To this end, the Diode ControlSection 181 includes a Diode Drive circuit 200 and a Divide-By-2 circuit201. In the exemplary circuitry depicted in FIG. 32, the Divide-By-2circuit 201 comprises a bi-stable flipflop 202 which receives a clocksignal at its input terminal C in the form of a square wave pulse 204output from the Repetition Rate Generator 189 (FIG. 31) to each of thePulse Generator 184, Variable Delay circuitry 186, and the Divide-by-2circuit 201--such clock pulse 204 ranging from zero volts (0 v) to plusfive volts (+5 v). Each input clock signal or pulse 204 serves to copythe signal present on the input terminal D of the flipflop 202 on itsoutput terminal Q. For example, when the input terminal D is low--i.e.,at zero volts (0 v)--an input square wave pulse signal 204 at the clockterminal C causes the zero volt (0 v) low signal present at inputterminal D to be reflected at the Q output terminal; while, at the sametime, a high signal level--i.e., plus five volts (+5 v)--is presented atthe Q output terminal of the flipflop 202, which high output signal isthen reflected at the input terminal D.

Consequently, the next clock signal 204 derived from the Repetition RateGenerator 189 causes the plus five volt (+5 v) high input signal atinput terminal D to be transferred to the Q output terminal and a low,or zero volt (0 v), signal to be presented at the Q output terminal ofthe flipflop 202 which is then reflected at the D input terminal. Inshort, alternate input clock signals 204 derived from the RepetitionRate Generator 189 cause the Q output signal level to alternate betweenzero volts (0 v) and plus five volts (+5 v), thereby producing one-halfas many rising pulse edges at the Q output terminal of the flipflop 202as are input on the input clock terminal C--i.e., a train ofpositive-going square wave pulses 205 is produced at the output terminalQ of the flipflop 202 having a frequency one-half (1/2) the frequency ofthe input clock pulses 204 derived from the Repetition Rate Generator189.

Each square wave pulse signal 205 ranging from zero volts (0 v) to plusfive volts (+5 v) output from the Q output terminal of the bi-stableflipflop 202 is then delivered to both the Delay circuit 196 in theSynchronous Detection Section 188 and the Diode Drive circuit 200 in theDiode Control Section 181. As shown in FIG. 32, the exemplary DiodeDrive circuit 200 includes: i) a transistor switch 206; ii) anOperational amplifier 208 having a positive lower path input terminal209, a negative upper path input terminal 210, and resistors R_(x),R_(y) and R_(z) where R_(x) is equal to R_(y) and either equal to, orapproximately equal to, R_(z) (in a practical embodiment of theinvention, all three resistors R_(x), R_(y), R_(z) are 10K resistors);and iii), a POSITIVE/NEGATIVE Diode Drive Select Switch 89 for enablingselective switching of one of the two diodes D₁, D₂ in the probe 99(FIG. 31).

Thus, the arrangement is such that when the POSITIVE/NEGATIVE DiodeDrive Select Switch 89 is in the solid line position shown in FIG.32--i.e., the SELECT NEGATIVE Diode Drive position--the transistorswitch 206 is turned ON, coupling the positive lower path input terminal209 of the operational amplifier 208 to ground. Under these conditions,the positive-going square wave pulses 205 which are output from theDivide-By-2 circuit 201 are input to the operational amplifier 208 viaits negative upper path input terminal 210; and, consequently, thepositive-going square wave input signals 205 are inverted by theoperational amplifier 208 which has an overall gain of minus one (-1)when the positive lower path input terminal 209 is coupled to ground! soas to provide a series of negative-going square wave output signals 211from the operational amplifier 208 ranging from zero volts (0 v) tominus five volts (-5 v).

The negative-going square wave pulse signals 211 output from theoperational amplifier 208 under these conditions are delivered to a biasinsertion network 79' (FIG. 31), and thence via control wire 212a,series current limiting resistor R2, and control wire 212b to thecoaxial cable's central conductor 66 and conductor 100 of probe 99.However, because of: i) the presence of the current limiting resistorR2; and ii), the current/voltage characteristics of the diode D₂,control wire 212b oscillates between zero volts (0 v) and about minusseven-tenths of a volt (-0.7 v) as indicated at 213 in FIG. 31, thuscausing the diode D₂ to switch between the open and shorted states asthe signal level output from the Diode Drive circuit 200 via the controlwire 212a oscillates between zero volts (0 v) and minus five volts (-5v).

If, on the other hand, the POSITIVE/NEGATIVE Diode Drive Select Switch89 is turned to the broken line position shown in FIG. 32--i.e., theSELECT POSITIVE Diode Drive position--the transistor switch 206 isturned OFF, causing the operational amplifier 208 to exhibit a gain ofplus two (+2) along its lower path via positive input terminal 209,while at the same time, the upper path still amplifies the signal 205with a gain of minus one (-1). The overall gain of the operationalamplifier 208 under these operating conditions is, therefore, plus one(+1). Consequently, the operational amplifier 208 serves to pass thepositive-going square wave pulses 205 output from the flipflop 202 as aseries of unchanged positive-going square wave pulse signals 214 eachranging from zero volts (0 v) to plus five volts (+5 v). Thepositive-going square wave output pulse signals 214 are delivered viathe bias insertion network 79' (FIG. 31), and thence via control wire212a and series current limiting resistor R2 to control wire 212b whichis coupled to the coaxial cable's central conductor 66 and, therefore,to conductor 100 of probe 99. Because of: i) the effect of currentlimiting resistor R2; and ii), the current/voltage characteristics ofthe diode D₁, control wire 212b oscillates between zero volts (0 v) andplus seven-tenths of a volt (+0.7 v) as indicated at 215 in FIG. 31,thus causing diode D₁ to switch between the open and shorted states asthe signal level output from the Diode Drive circuit 200 via controlwire 212a oscillates between zero volts (0 v) and plus five volts (+5v).

Those skilled in the art will appreciate that actuation of thePOSITIVE/NEGATIVE Diode Drive Select Switch 89 (FIGS. 31 and 32) can beachieved in any desired fashion. For example, the switch 89 may beoperated manually by the operator of the apparatus 180 (FIG. 31).Alternatively, it may be operated electromechanically or by any suitableelectronic control circuit (not shown); or, it may be operated by acomputer, microprocessor controller or the like (not shown) used tocontrol operation of the entire modified exemplary electronic TDRapparatus 180 embodying features of the present invention.

Having in mind the foregoing description of the operation of the DiodeControl Section 181 of the modified exemplary TDR apparatus 180 asdepicted in FIGS. 31 and 32, and having an understanding that suchcircuitry serves to pass a series of either negative-going square wavepulses 213 or positive-going square wave pulses 215 to the probe 99(FIG. 31) via the bias insertion network 79' and control wire 212b forpurposes of selectively switching the diodes D₁, D₂ between the open andshorted states, the overall operation of the modified exemplary TDRsystem 180 employing synchronous detection will now be described. As theensuing description proceeds, it will be understood that thepositive-going square wave pulses 214 ranging from zero volts (0 v) toplus five volts (+5 v) are used for the purpose of switching the diodeD₁ between the open state--e.g., when the signal level of the train ofpulses 214 output from the Diode Drive circuit 200 shown in FIG. 32 is,at a given point in time, zero volts (0 v) and, therefore, the signallevel on control wire 212b is also zero volts (0 v)--and the shortedstate--e.g., when the signal level of the train of pulses 214 outputfrom the Diode Drive circuit 200 is, at a given point in time, plus fivevolts (+5 v) and, therefore, the signal level on the control wire 212bis about plus seven-tenths of a volt (+0.7 v) as indicated at 215 inFIG. 31.

Similarly, the negative-going square wave pulses 211 ranging from zerovolts (0 v) to minus five volts (-5 v) are used to switch the diode D₂between the open state--e.g., when the signal level of the train ofpulses 211 output from the Diode Drive circuit 200 is, at a given pointin time, zero volts (0 v) and, therefore, the signal level on controlwire 212b is also at zero volts (0 v)--and the shorted state--e.g., whenthe signal level of the train of pulses 211 is, at a given point intime, minus five volts (-5 v) and, therefore, the signal level on thecontrol wire 212b is about minus seven-tenths of a volt (-0.7 v) asindicated at 213 in FIG. 31.

In operation, the Repetition Rate Generator 189 and Pulse Generator 184(FIG. 31) serve to generate a series of fast rise time step pulses (200to 500 picoseconds) at a constant repetition rate which are propagateddown the coaxial cable 54 and along the transmission line probe 99extending through the soil or other material to be analyzed. Such pulsesproduce, in the manner previously described, reflections from, forexample, the air/probe interface, the end of the probe, discontinuitiescreated when the diodes D₁, D₂ are shorted, and/or other discontinuitiesin, for example, the moisture characteristics of the material undergoingtest, which reflections travel up the coaxial cable 54 and arecontinuously sampled by the Sample-And-Hold circuit 185.

Once again, typical waveforms that are observable at the input of theSample-And-Hold circuit 185 when using, for example, a 10,000 megacyclebandwidth oscilloscope (not shown) are depicted in FIGS. 5, 5A and 5B.Thus, assuming both diodes D₁, D₂ are open--i.e., that the signal leveloutput from the Diode Control Section 181 is momentarily at zero volts(0 v)--the reflections from the fast rise time pulses propagated downthe coaxial cable/transmission line probe 54/99 by the Pulse Generator184 will produce a waveform such as that shown by way of example at 75in FIG. 5. On the other hand, when diode D₁ is shorted--i.e., when thesignal level of the pulses output from the Diode Control Section 181 isat plus five volts (+5 v) and the signal level on control wire 212b isat plus seven-tenths of a volt (+0.7 v)--the waveform 75 will exhibit asteep negative-going ramp 75a at time T₁ as shown in FIG. 5A; and, whendiode D₂ is shorted--i.e., when the signal level of the pulse outputfrom the Diode Control Section 181 is at minus five volts (-5 v) and thesignal level on control wire 212b is at minus seven-tenths of a volt(-0.7 v)--the waveform 75 exhibits a steep negative-going ramp 75b attime T₂ as shown in FIG. 5B.

Due to the operation of the Diode Drive circuit 200, the amplitude ofthe reflection sampled by the Sample-And-Hold circuit 185 at time T_(n)repetitively alternates between the diode-open reflection 75 as shown inFIG. 5 and the diode shorted wave form 75a or 75b as shown in FIGS. 5Aor 5B. Thus, the output from the Sample-And-Hold circuit 185 comprises asquare wave pulse 216 wherein the frequency of the square wave isone-half (1/2) the frequency of the square wave pulses 204 output fromthe Repetition Rate Generator 189; while the amplitude of the squarewave pulse 216 is proportional to the difference between the amplitudeof the output from the Sample-And-Hold circuit 185 arising from thediode-open reflection at time T and the amplitude of the Sample-And-Holdcircuit output arising from the diode shorted reflection at time T. Thesquare wave signal 216 output from the Sample-And-Hold circuit 185 tendsto be weak and, moreover, tends to be somewhat obscured by switchingtransients and other undesirable noise. Accordingly, the signal ispassed through AC Amplifier 190, Filter 191 and AC Amplifier 192, withFilter 191 serving to remove large transients and some noise, and thusimproving the signal-to-noise ratio. The AC Amplifier 192 removes any DCcomponent from the signal.

The thus amplified and filtered noisy square wave signal 217 output fromAC Amplifier 192 is then passed to the Analog Multiplier 194. The secondinput to the Analog Multiplier 194 is the one-half (1/2) rate squarewave pulse 205 output from the Divide-By-Two circuit 201 which has beenpassed through the Delay circuit 196 and is output from the AC coupledBuffer Amplifier 198, which serves to remove the DC component, as apositive-going square wave pulse 218. The signal 218 is commonly knownby persons skilled in the art as the "Synchronous Detector ReferenceSignal". The frequency of the Synchronous Detector Reference Signal 218is identical to the frequency of the noisy square wave signal 217 outputfrom AC Amplifier 192. The polarity of the AC coupled Buffer Amplifier198 and the Delay characteristics of the Delay circuit 196 are arrangedso that the two input signals 217, 218 to the Analog Multiplier 194 arein phase.

The Analog Multiplier 194 and the Low Pass Filter 195 act like an idealfilter/detector, converting the amplitude of the noisy square wavesignal 217 input to the Analog Multiplier 194 into a DC output signalV(T) representative of the difference function indicated in FIG. 6 asthe positive-going ramps 90, 91 respectively located at points T₁ (whendiode D₁ is alternately shorted and opened) and T₂ (when diode D₂ isalternately shorted and opened). The Analog Multiplier 194 and Low PassFilter 195 also further improve the signal-to-noise ratio. The amount ofsignal-to-noise ratio improvement is proportional to the smoothing(integration) time of the Low Pass Filter 195. The Low Pass Filterintegration time is typically set to equal fifty (50) to two hundred(200) full cycles of the noisy square wave pulse 217.

It will be recognized by those skilled in the art that the output of theSample-And-Hold circuit 185 may actually be a drooping square wave dueto the discharge characteristics of the hold capacitor (not shown)within the Sample-And-Hold circuit 185. In this case, the Filter 191 maybe advantageously replaced with a second Sample-And-Hold circuit (notshown) to convert the signal from a drooping square wave into a truesquare wave 217.

The Synchronous Detection System hereinabove described in connectionwith FIG. 31 can also be advantageously used with probes which do nothave remote shorting capability such, for example, as a probe similar tothe probe 99 depicted in FIGS. 11, 12 and 31, but which is not providedwith the remotely operable active shorting diodes D₁ and/or D₂ ; or,alternatively, with probes having only a single shorting diode D₁adjacent the coaxial cable/probe interface 54/92', 54/94' such as shownin FIGS. 9 and 10. Such an arrangement is particularly advantageous withrelatively homogeneous soils of the type found in seedling nurserieswhere the natural reflection from the end of the transmission line/probeat time T₂ is typically large and free from distortion.

To this end, when operation in a time delay modulation mode is desired,as contrasted with remotely shortable diode ON/OFF modulation aspreviously described, it is merely necessary to insure that control wire212a is grounded, thereby precluding remote switching of either diode D₁or D₂. To accomplish this, a Diode ON/OFF Modulation/Time DelayModulation switch 219 (FIG. 31) is shifted from the solid line DiodeON/OFF Modulation position shown in the drawing to the broken line TimeDelay Modulation position, thereby disrupting the flow ofnegative-going/positive-going pulses 211/214 and coupling control wire212a to ground. At the same time, the Variable Delay circuit 186 (FIG.31) in the RF section 182 of the exemplary TDR apparatus 180 isalternated--using any suitable and conventional electronic or computercontrol circuit (not shown) to provide a suitable time delay modulationinput at 199 capable of switching between two preset time delay circuits(not shown) contained within the Variable Delay circuit 186--betweenfirst and second preset time delays T_(A) and T_(B) at one-half (1/2)the repetition rate established by the Repetition Rate Generator 189where: ##EQU2## where "r" is the approximate rise time of the reflectedpulse.

The foregoing arrangement, which has been depicted graphically in FIGS.33 and 34, generates a square wave 216 at the output of theSample-And-Hold circuit 185 whose amplitude is proportional to the slopeof the reflection, thereby reducing background noise and allowingimproved detection of the normally distinctive steep natural reflectionfrom the end of the probe. Such a method, in effect, "differentiates"the reflected waveform prior to amplification and filtering in theSynchronous Detection Section 188 of the modified exemplary electronicTDR apparatus 180.

The foregoing synchronous detection technique is of economic andpractical importance since a TDR instrument 180 employing an RF Section182 and a Synchronous Detection Section 188--irrespective of whether aDiode Control Section 181 is or is not present, or is or is not beingutilized--can be effectively used with probes having natural or passivereflective elements and wherein synchronous detection is necessary forthe remotely shorting diodes or similar active elements. Morespecifically, this embodiment of the invention permits a singleelectronic design--such as the modified exemplary TDR system 180embodying features of the present invention as depicted in FIG. 31--tomeasure time delays for any active or passive reflective element in aTDR system by using either: i) remotely shortable diode ON/OFFmodulation; or ii), time delay modulation.

In accordance with yet another of the important objectives of thepresent invention, provision is made for designing probes havingmultiple pairs of serially arranged, remotely operable, oppositelydirected, variable impedance devices--such, for example, as PIN diodesor the like--so as to form a multi-segment probe wherein each pair ofoppositely directed diodes defines the boundaries of adjacent segmentson the probe. To this end, and as best illustrated in FIG. 35, amulti-segment bayonet-type probe, generally indicated at 220, has beendepicted having a pair of flat, elongate, parallel, spaced conductors221, 222 each having a rectangular cross section, with the conductorsbeing spaced apart by, and integrally bonded to, an internal or centralnon-conductive dielectric spacer 224.

In this instance three (3) pairs of oppositely directed, normally open,remotely operable PIN diodes--viz., diode pair D₁ /D₂ ; diode pair D₃/D₄ ; and, diode pair D₅ /D₆ --or other suitable remotely operable,active variable impedance devices are imbedded in the dielectric spacer224 at generally equally spaced points along the length thereof (thoseskilled in the art will, however, appreciate that the diode pairs can beunequally spaced if desired), with each diode being coupled to the probeconductors 221, 222. Referring to FIG. 35, it will be noted that diodesD₁, D₂ defining diode pair D₁ /D₂ and diodes D₃, D₄ defining diode pairD₃ /D₄ are all electrically coupled to probe conductors 221, 222utilizing RF coupling networks defined by resistors R and capacitors C,whereas diodes D₅, D₆ defining diode pair D₅ /D₆ are electricallycoupled directly to the probe conductors 221, 222 without employment ofRF coupling networks and in precisely the same manner as previouslydescribed in connection with FIGS. 13 through 17.

As in the case of some of the probes previously described herein--forexample, probe 99 depicted in FIGS. 11 through 17, probe 115 depicted inFIG. 20, and probe 126 depicted in FIG. 25--the internal dielectricspacer 224 is preferably provided with a relatively sharp pointed probeend 225 so as to facilitate insertion of the probe 220 into the soil orother test medium without significant disturbance thereof.

Prior to pouring of the liquid dielectric material into the spaceintermediate the spaced parallel conductors 221, 222, diode pairs D₁ /D₂and D₃ /D₄, together with their RF coupling networks defined byresistors R and capacitors C, and diode pair D₅ /D₆, are preferablymounted on small circuit boards (not shown, but similar to the circuitboards 111 depicted in FIGS. 13, 16 and 17); and, are properlypositioned between the probe conductors 221, 222 and electricallycoupled thereto in the manner previously described in connection withthe probe 99 depicted in FIGS. 13 through 17. In this instance, however,diode pairs D₁ /D₂ and D₃ /D₄ and their associated RF coupling networksare each electrically coupled to a separate control wire--e.g., the pairof diodes D₁ /D₂ and their associated RF coupling networks defined byresistors R and capacitors C are electrically coupled to a control wire226 terminating at terminal 228 external to the probe 220; while thepair of diodes D₃ /D₄ and their associated RF coupling networks areelectrically coupled to a second separate and independent control wire229 terminating at terminal 230 external to the probe 220.

In keeping with this aspect of the invention, each of the resistors Rare coupled in parallel with respective different ones of the variableimpedance devices--i.e., the diodes D₁ . . . D₄ between probe conductor221 and the one of the control wires 226, 229 associated therewith fordischarging any residual charge on the variable impedance devices whenswitched to the open state. Each of the capacitors C are connected inseries between respective different ones of the variable impedancedevices D₁ . . . D₄ and probe conductor 222 so as to provide a highfrequency short circuit therebetween. Thus, each variable impedancedevice D₁ . . . D₄ is AC-coupled to the probe conductors 221, 222through its associated series connected capacitor C.

As the ensuing description proceeds, it will become evident to personsskilled in the art that a multi-segment probe embodying features of thepresent invention and of the type depicted in FIG. 35 is not limited toany particular probe conductor structure--e.g., the probe conductorsneed not be formed of barstock of rectangular cross section--nor aresuch probes limited to use with three (3) pairs of variable impedancedevices defining a three-segment probe. Rather, multi-segment probesmade in accordance with the present invention can employ two, three,four or more pairs of longitudinally spaced, oppositely directed diodesor other variable impedance devices provided only that a separatecontrol wire is provided for at least the second, third and eachadditional pair of diodes D₁ /D₂ . . . D_(n-3) /D_(n-2). Alternatively,and although not shown in the drawings, all of the diode pairs,including diode pair D₅ /D₆, may be provided with separate control wiresand employ RF coupling networks defined by resistors R and capacitorsC--a configuration found particularly advantageous when the probe isintended for use in saline soils.

Once the pairs of diodes D₁ /D₂ . . . D_(n-1) /D_(n) (where "n" is anywhole even integer equal to or greater than "4"--e.g., "n" is equal to"4", "6", "8", etc.), RF coupling networks for the second and eachadditional pair of diodes, and control wires 226, 229 for the second andeach additional pair of diodes, are properly positioned intermediate theprobe conductors 221, 222 and electrically bonded thereto, the liquiddielectric material is poured into the cavity therebetween utilizing anydesired bonding technique such, for example, as one of those describedpreviously in connection with FIGS. 13 through 17 or FIG. 18. After thedielectric material has set, hardened and cured, the diodes D₁ throughD₆, RF coupling networks defined by resistors R and capacitors C, andcontrol wires 226, 229 are firmly imbedded within, and protected by, thedielectric spacer material 224; with the control wires 226, 229respectively terminating external to the probe at terminals 228, 230.

In carrying out this aspect of the invention, the exemplarymulti-segment stripline probe 220 depicted in FIG. 35 is coupled to anysuitable TDR instrument--for example, the conventional TDR instrument 51depicted in FIG. 4 or the modified exemplary TDR instrument 180 depictedin FIG. 31 which embodies features of the present invention--by meansof: i) a coaxial cable 54; and ii), a modified bias insertion networksuch as that shown generally at 231 in FIG. 36A. For convenience, theprobe 220 is here shown coupled to a TDR instrument 180 (FIG. 36B) whichis identical in construction and mode of operation to the TDR instrument180 previously described in connection with FIG. 31.

In this instance, however, the POSITIVE/NEGATIVE Diode Drive SelectorSwitch 89 (FIGS. 32 and 36B) does not serve to select any specific diodebut, rather, it serves to select either POSITIVE diodes D₁, D₃, D₅ orNEGATIVE diodes D₂, D₄, D₆ --i.e., POSITIVE diodes D₁, D₃, D₅ comprisingodd numbered diodes which are forward biased into conduction when apositive voltage is impressed on the conductors 222, 226 or 229; and,NEGATIVE diodes D₂, D₄, D₆ comprising even numbered diodes which areforward biased into conduction by impressing a negative voltage on theconductors 222, 226, 229. When the NEGATIVE diodes are selected, thePOSITIVE/NEGATIVE Diode Drive Select Switch 89 is positioned in thesolid line position shown in FIG. 32, thereby enabling generation ofnegative-going square wave output pulses 211 from the Diode ControlSection 181 in the manner previously described for enabling selectiveactivation of one of the NEGATIVE diodes D₂, D₄, or D₆ ; whereas, whenthe switch 89 is positioned in the broken line position shown in FIG.32, positive-going square wave output pulses 214 are output from theDiode Control Section 181 for enabling selective actuation of one of thePOSITIVE diodes D₁, D₃, or D₅.

Referring next to FIG. 36A, it will be noted that the exemplary biasinsertion network 231 includes: i) a first Diode Select Switch 89' whichis coupled to a first pair of ganged switches S3 (for selecting eitherdiode pair D₁ /D₂ or one of diode pairs D₃ /D₄ or D₅ /D₆) and S4 (forgrounding either diode pair D₁ /D₂ or one of diode pairs D₃ /D₄ or D₅/D₆); and ii), a second Diode Select Switch 89" coupled to a second pairof ganged switches S₅ (for selecting either diode pair D₃ /D₄ or diodepair D₅ /D₆) and S₆ (for grounding either diode pair D₃ /D₄ or diodepair D₅ /D₆). Terminals T3 and T4' of switches S3 and S4, respectively,are coupled via control wire 226a, current limiting resistor R_(a), andcontrol wire 226b to control wire 226 associated with diode pair D₁ /D₂in probe 220; while terminals T5 and T6' of switches S5 and S6,respectively, are coupled via control wire 229a, current limitingresistor R_(b), and control wire 229b to control wire 229 associatedwith diode pair D₃ /D₄.

Thus, the arrangement is such that in operation--and, assuming: i) thatthe POSITIVE/NEGATIVE Diode Drive select Switch 89 (FIGS. 32 and 36B) ispositioned to select one of the POSITIVE diodes D₁, D₃ or D₅ (i.e.,assuming that the switch 89 is in the broken line position shown in FIG.32 so as to cause output of positive-going square wave output pulses 214from the Diode Control Section 181 of the TDR instrument 180); and ii),that the Diode Select Switches 89', 89" (FIG. 36A) are in the solid linepositions shown in the drawing--the circuitry will be initiallyconfigured to cause diode D₁ to alternate between the open and shortedstates while all other diodes D₂ through D₆ remain open. This is due tothe fact that the positive-going square wave pulses 214 output from theDiode Control Section 181 of the TDR instrument 180 (FIG. 36B) areconveyed via switch S3, its terminal T3, control wire 226a, and currentlimiting resistor R_(a), to control wire 226b and thence to terminal 228and control wire 226; while control wires 229a and 229b and, therefore,229 are grounded via switch/terminal S4/T4, switch/terminal S5/T5 andcurrent limiting resistor R_(b). At the same time, the central conductor66 of the coaxial cable 54, which is coupled to probe conductor 222, isalso coupled to ground via switch/terminal S6/T6, control wire 232a,current limiting resistor R_(c), and control wire 232b. Since controlwires 229, 229a, 229b and control wires 232a, 232b are grounded, pulsesoutput from the Diode Control Section 181 (FIG. 36B)--whetherpositive-going pulses 214 or negative-going pulses 211--are incapable ofbiasing any of diodes D₃ through D₆ into conduction and, consequently,diodes D₃ through D₆ remain open.

As the positive-going square wave pulses 214 output from the DiodeControl Section 181 (FIG. 36B) travel down the control wire 226a (FIG.36A), the signal level on the control wire 226a oscillates between zerovolts (0 v) and about plus five volts (+5 v). However, because of: i)the effect of current limiting resistor R_(a) ; and ii), thecurrent/voltage characteristics of the diode D₁, the signal level oncontrol wire 226b, and, therefore, on control wire 226, oscillatesbetween zero volts (0 v) and about plus seven-tenths of a volt (+0.7 v)as indicated at 234 in FIG. 36A, causing POSITIVE diode D₁ to switchbetween the open state when the signal level on the control wire 226a iszero volts (0 v) and the shorted state when the signal level on thecontrol wire 226a is plus five volts (+5 v). At the same time, the plusseven-tenths of a volt (+0.7 v) signal level produced on the controlwire 226 is incapable of biasing NEGATIVE diode D₂ into conduction; and,therefore, NEGATIVE diode D₂ remains open.

Assuming next that the Diode Select Switches 89', 89" (FIG. 36A) remainin the solid line position shown, but that the POSITIVE/NEGATIVE DiodeDrive Select Switch 89 (FIGS. 32 and 36B) is shifted to the solid lineposition shown in FIG. 32, the Diode Drive circuit 200 is now configuredso as to output a series of negative-going square wave pulses 211 fromthe Diode Control Section 181 of the TDR instrument 180. Since DiodeSelect Switches 89', 89" remain unchanged, control wires 229a, 229b and229, as well as control wires 232a and 232b all remain grounded; and,consequently, diodes D₃ through D₆ remain open. However, under theseoperating conditions, the negative-going square wave pulses 211 carriedon control wire 226a via switch/terminal S3/T3 cause the signal level oncontrol wire 226a to oscillate between zero volts (0 v) and minus fivevolts (-5 v). When the signal level on control wire 226a is zero volts(0 v), both diodes D₁ and D₂ remain open; but, when the signal level oncontrol wire 226a is lowered to minus five volts (-5 v), the currentlimiting resistor R_(a) causes the voltage level on control wires 226band 226 to be reduced to about minus seven-tenths of a volt (-0.7 v) asindicated at 235 in FIG. 36B, which serves to forward bias NEGATIVEdiode D₂ into conduction, shorting the probe conductors 221, 222 at theposition of diode D₂. POSITIVE diode D₁, however, remains open since aminus seven-tenths of a volt (-0.7 v) signal level on control wire 226is incapable of biasing the oppositely directed POSITIVE diode D₁ intoconduction.

Assuming next that: i) the POSITIVE/NEGATIVE Diode Drive Select Switch89 (FIGS. 32 and 36B) is in the broken line position shown in FIG. 32configuring the Diode Drive circuit 200 to output a series ofpositive-going square wave pulses 214; ii) Diode Select Switch 89' (FIG.36A) is switched to the broken line position shown in the drawing; andiii), Diode Select Switch 89" (FIG. 36A) remains in the solid lineposition shown, the circuitry of FIGS. 36A and 36B will be configured toswitch diode D₃ between the open and shorted states. More specifically,under these conditions: a) control wire 226a is coupled to ground viaswitch/terminal S4/T4', thus coupling control wire 226b via currentlimiting resistor R_(a) and control wire 226 to ground so as to precludebiasing of diodes D₁ /D₂ into conduction; b) control wire 229a iscoupled directly to the output from the Diode Control Section 181 (FIG.36B) of the TDR instrument 180 via switch/terminal S3/T3' andswitch/terminal S5/T5; and, consequently, as the voltage level oncontrol wire 229a oscillates between zero volts (0 v) and plus fivevolts (+5 v), the voltage level on control wires 229b and 229 will, dueto: i) the effect of current limiting resistor R_(b) ; and ii), thecurrent/voltage characteristics of the diode D₃, oscillate between zerovolts (0 v) and about plus seven-tenths of a volt (+0.7 v) as indicatedat 234, thus permitting switching of the diode D₃ dependent solely uponthe position of the POSITIVE/NEGATIVE Diode Drive Select Switch 89(FIGS. 32 and 36A) which is here assumed to be in the broken lineposition shown in FIG. 32 so as to configure the circuitry to outputpositive-going square wave pulses 214 from the Diode Control Section181; and c), control wire 232a remains coupled to ground viaswitch/terminal S6/T6; and, therefore, control wire 232b is grounded viacurrent limiting resistor R_(c) so as to preclude biasing of diodes D₅/D₆ into conduction which, therefore, remain open.

Under these conditions, and as will be best understood upon reference toFIG. 36a, as the signal level on control wire 229a oscillates betweenzero volts (0 v) and plus five volts (+5 v), the signal level on controlwires 229b and 229 will, due to the effect of current limiting resistorR_(b) and the current/voltage characteristics of the diode D₃, oscillatebetween zero volts (0 v) and about plus seven-tenths of a volt (+0.7 v);and, therefore, both diodes D₃ and D₄ remain open whenever the signallevel on control wire 229 is at zero volts (0 v); but, when the signallevel on control wire 229 is at plus seven-tenths of a volt (+0.7 v),POSITIVE diode D₃ is forward biased into conduction, effectivelyshorting the probe conductors 221, 222 at the diode D₃ position.However, NEGATIVE diode D₄ remains open since a plus seven-tenths of avolt (+0.7 v) signal level on the control wire 229 is incapable ofbiasing the oppositely directed NEGATIVE diode D₄ into conduction.

However, if the POSITIVE/NEGATIVE Diode Drive Select Switch 89 (FIGS. 32and 36B) is now shifted to the solid line position shown in FIG. 32, theDiode Control Section 181 of the TDR instrument 180 will then beconfigured to output a series of negative-going square wave pulses 211to the bias insertion network 231. Assuming further that Diode SelectSwitch 89' (FIG. 36A) remains in the broken line position shown in thedrawing while Diode Select Switch 89" remains in the solid line positionshown, the negative-going square wave pulses 211 input to the biasinsertion network 231 (FIG. 36A) from the Diode Control Section 181 ofthe TDR instrument 180 (FIG. 36B) will be propagated down control wire229a via switch/terminal S3/T3' and switch/terminal S5/T5, causing thesignal level on the control wire 229a to oscillate between zero volts (0v) and minus five volts (-5 v). Consequently, the signal level oncontrol wires 229b and 229 will, because of: i) the effect of currentlimiting resistor R_(b) ; and ii), the current/voltage characteristicsof the diode D₄, oscillate between zero volts (0 v) and about minusseven-tenths of a volt (-0.7 v) as indicated at 235 in FIG. 36A. Whenthe signal level on the control wire 229 is at zero volts (0 v), bothdiodes D₃ and D₄ remain open; but, when the signal level on the controlwire 229 is lowered to minus seven-tenths of a volt (-0.7 v), NEGATIVEdiode D₄ is forward biased into conduction, effectively shorting theprobe conductors 221, 222 at the diode D₄ position. POSITIVE diode D₃,however, remains open since a minus seven-tenths of a volt (-0.7 v)signal level on the control wire 229 is incapable of biasing theoppositely directed POSITIVE diode D₃ into conduction.

Assuming next that both Diode Select Switches 89' and 89" are shifted tothe broken line positions shown in FIG. 36A, it will be noted thatcontrol wire 226a remains coupled to ground via switch/terminal S4/T4'and, consequently, control wires 226b and 226, which are coupled to thegrounded control wire 226a via current limiting resistor R_(a), remaingrounded, thereby insuring that diodes D₁, D₂ remain open. However,control wire 229a is now coupled to ground via switch/terminal S6/T6',thereby insuring that diodes D₃, D₄ which are coupled to groundedcontrol wire 229a via current limiting resistor R_(b) and control wires229b and 229, remain open. Consequently, dependent only upon theposition of the POSITIVE/NEGATIVE Diode Drive Select Switch 89 (FIGS. 32and 36B), one of the diodes D₅ /D₆ will be switched between the open andshorted states since the central conductor 66 of the coaxial cable 54will now be directly coupled to the Diode Control Section 181 of the TDRinstrument 180 (FIG. 36B) via switch/terminal S3/T3', switch/terminalS5/T5', control wire 232a, current limiting resistor R_(c), and controlwire 232b.

Assuming the POSITIVE/NEGATIVE Diode Drive Select Switch 89 is in thebroken line position shown in FIG. 32, the Diode Drive Circuit 200 willbe configured to output positive-going square wave pulses 214 from theDiode Control Section 181 of the TDR instrument 180; and, consequently,the signal level on control wire 232a will oscillate between zero volts(0 v) and plus five volts (+5 v), while the signal level on control wire232b will, because of: i) the current limiting resistor R_(c) ; and ii),the current/voltage characteristics of the diode D₅, oscillate betweenzero volts (0 v) and about plus seven-tenths of a volt (+0.7 v) asindicated at 234 in FIG. 36A. When the sisal level on control wire 232bis at zero volts (0 v), both diodes D₅ and D₆ remain open; but, when thesignal level on control wire 232b rises to plus seven-tenths of a volt(+0.7 v), POSITIVE diode D₅ is forward biased into conduction,effectively shorting the probe conductors 221, 222 at the diode D₅position. However, oppositely directed NEGATIVE diode D₆ remains opensince a plus seven-tenths of a volt (+0.7 v) signal level on conductor222 is incapable of biasing NEGATIVE diode D₆ into conduction.

Finally, assuming that the POSITIVE/NEGATIVE Diode Drive Select Switch89 is shifted to the solid line position shown in FIG. 32, the DiodeDrive circuitry 200 is configured to output negative-going square wavepulses 211 from the Diode Control Section 181 of the TDR instrument 180;and, under these conditions, such negative-going square wave pulses 211are conveyed via switch/terminal S3/T3' and switch/terminal S5/T5' tocontrol wire 232a, causing the latter to oscillate between zero volts (0v) and minus five volts (-5 v). Consequently, because of: i) the currentlimiting resistor R_(c) ; and ii), the current/voltage characteristicsof diode D₆, the signal level on control wire 232b will oscillatebetween zero volts (0 v) and about minus seven-tenths of a volt (-0.7 v)as indicated at 235 in FIG. 36A. When the signal level on control wire232b is zero volts (0 v), both diodes D₅, D₆ (FIG. 35) remain open; but,when the signal level on control wire 232b is at about minusseven-tenths of a volt (-0.7 v), NEGATIVE diode D₆ is forward biasedinto conduction, effectively shorting probe conductors 221, 222 at thediode D₆ position while oppositely directed POSITIVE diode D₅, whichcannot be biased into conduction by a negative-going pulse, remainsopen.

As thus far described, it will be appreciated that the exemplarymulti-segment probe 220 depicted in FIG. 35 can be operated as a3-segment probe employing three (3) diode pairs--viz., diode pair D₁ /D₂defining a first segment extending from the diode D₁ location to thediode D₂ location; diode pair D₃ /D₄ defining a second segment extendingfrom the diode D₃ location to the diode D₄ location; and, diode pair D₅/D₆ (i.e., diode pair D_(n-1) /D_(n) where "n" is equal to "6") defininga third segment extending from the diode D₃ location to the diode D₆location. It will further be appreciated from the foregoing descriptionthat operation of the TDR apparatus 180 (FIGS. 36A and 36B) using such aprobe 220 serves to generate six (6) precise, unambiguous timing markersT₁, T₂ . . . T₆ at the six (6) spaced locations of respective ones ofdiodes D₁, D₂ . . . D₆.

However, since six (6) precise, unambiguous timing markers T₁, T₂ . . .T₆ are generated at six (6) spaced locations, those skilled in the artwill appreciate that the multi-segment probe 220 depicted in FIG. 35can, where desired, actually be operated as 5-segment probe--viz., i) afirst segment defined by, and spanning the space between, diodes D₁ andD₂ ; ii) a second segment defined by, and spanning the space between,diodes D₂ and D₃ ; iii) a third segment defined by, and spanning thespace between, diodes D₃ and D₄ ; iv) a fourth segment defined by, andspanning the space between, diodes D₄ and D₅ ; and v), a fifth segmentdefined by, and spanning the space between, diodes D₅ and D₆.

When operating the multi-segment probe 220 (FIGS. 35 and 36A) as a5-segment probe, it is merely necessary to: i) rapidly and repeatedlyopen and short diode D₁ by impressing a positive voltage level oncontrol wires 226a, 226b and 226 to establish a first timing marker T₁in the manner previously described; ii) rapidly and repeatedly open andshort diode D₂ by impressing a negative voltage level on the controlwires 226a, 226b and 226 to establish a second timing marker T₂ ; iii)process the reflection data sampled at T₁ and T₂ to determine the timeof travel and, therefore, the propagation velocity of energy pulsestraveling along the first segment defined by diodes D₁ and D₂ ; iv)rapidly and repeatedly open and short diode D₃ by impression of apositive voltage level on control wires 229a, 229b and 229 to establisha third timing marker T₃ ; and v), process the reflection data sampledat T₂ and T₃ to determine the time of travel and, therefore, thepropagation velocity of energy pulses traveling along the second segmentof the probe defined by diodes D₂ and D₃.

The foregoing process steps are then repeated to rapidly open and shortdiode D₄ using a negative voltage level impressed on control wires 229a,229b and 229 to determine T₄ and, thereafter, processing the reflectiondata sampled at timing markers T₃ and T₄ to determine the propagationvelocity of energy pulses traveling along the third probe segmentdefined by diodes D₃ and D₄. The foregoing process is then followed byrepetitive opening and shorting of diode D₅ by impression of a positivevoltage level on control wires 232a, 232b, 66 and 222 to establish afifth timing marker T₅ and subsequent processing of the reflection datasampled at timing markers T₄ and T₅ to determine the propagationvelocity of energy pulses traveling along the fourth probe segmentdefined by the diodes D₄ and D₅. Finally, D₆ is measured by impressing anegative voltage level on control wires 232a, 232b, 66 and 222 torapidly and repeatedly open and short diode D₆, with the reflection datasampled at T₅ and T₆ being processed to determine the propagationvelocity of energy pulses traveling along the fifth probe segmentdefined by diodes D₅ and D₆.

In short, it will be understood that in its broadest sense, amulti-segment probe 220 such as shown in FIG. 35 can include a pluralityof pairs of diodes where the boundary between adjacent segments isdefined by a single diode; and, consequently, a multi-segment probe canbe defined by diodes D₁, D₂ . . . D_(n) where "n" is any whole integerequal to or greater than "3". In other words, where "n" is equal to "3",a 2-segment probe is defined by diode pairs D₁ /D₂, D₂ /D₃ ; where "n"is equal to "4", a 3-segment probe is defined by diode pairs D₁ /D₂, D₂/D₃ and D₃ /D₄ ; etc.

It will be noted that in the various exemplary probe/coaxial cablearrangements described hereinabove, the coaxial cable 54 has beendepicted as being electrically coupled to the probe conductors 62, 64(FIGS. 4, 7 and 9), 95, 96, 98 (FIGS. 8 and 10), 100, 101 (FIGS. 11 and31) and 221, 222 (FIGS. 35 and 36A) adjacent the proximal ends of theprobe conductors--i.e., adjacent the air/probe interface. However, theinvention is not limited to such an arrangement. To the contrary, andalthough not shown in the drawings, those skilled in the art willappreciate that the coaxial cable 54 can extend longitudinally along theprobe conductors and be electrically coupled thereto at any desiredpoint intermediate the proximal and distal ends of the probe conductorsprovided only that a remotely operable, normally open, variableimpedance device is coupled across the probe conductors adjacent thecoaxial cable/probe conductor interface for establishing a precise,unambiguous timing marker T at that interface.

For example, when dealing with saline soils--indeed, even moderatelysaline soils--it has been found that excellent results can be achievedwhere the coaxial cable 54 comprises a thin coaxial cable (such, forexample, as a type RG-174 coaxial cable) which is electrically coupledto the probe conductors at a point approximately midway between theproximal and distal ends of the probe conductors and wherein a suitableremotely operable, normally open, variable impedance device is coupledacross the probe conductors at the interface between the coaxial cableand the probe conductors. Such an arrangement insures that fast risetime pulses propagated along the probe conductors from the coaxialcable/probe conductor interface towards the variable impedance deviceslocated adjacent the probe's proximal and distal ends need travel onlyone-half (1/2) the effective length of the probe as contrasted with thefull effective length of the probe where the coaxial cable is coupled tothe probe's proximal end.

Those skilled in the art will appreciate that the particular meansprovided for shifting the POSITIVE/NEGATIVE Diode Drive Select Switch 89(FIGS. 32 and 36B) and the Diode Select Switches 89', 89" (FIG. 36A)from one position to another form no part of the present invention andare well within the capability of persons skilled in the art relating toelectronic circuit design. Thus, such switches may, if desired, bemanually and independently controlled by the operator of the TDR system180. Alternatively, the switches may be electro-mechanically orelectronically controlled by any suitable control circuit (not shown).Preferably, however, the entire TDR system 180 will be computercontrolled; and, in this type of system: i) the POSITIVE/NEGATIVE DiodeDrive Select Switch 89 (FIGS. 32 and 36B); ii) the Diode Select Switches89', 89" (FIG. 36A); iii) the input T to the Variable Delay circuit 186in the RF section 182 (FIG. 36B) of the TDR instrument 180; iv) theDiode ON/OFF Modulation/Time Delay Modulation switch 219; and v), theDelay Modulation input 199 when the TDR system 180 is being operated inthe time delay modulation mode rather than in the remotely shortablediode ON/OFF modulation mode, will all be controlled by one or moresuitable microprocessor chips in an overall computer control system (notshown). Moreover, in such an overall computerized control system, theoutput V(T) from the Low Pass Filter 195 (FIG. 36B) will preferably besampled by an Analog-To-Digital converter (not shown) and input to thecomputer control.

It will be appreciated from the foregoing description relating to FIGS.35, 36A and 36B that there has herein been described a simple, yethighly effective, multi-segment, bayonet-type or stripline probe 220(FIG. 35) and control system therefor (FIGS. 32, 36A and 36B) capable ofselectively switching the diodes in multiple adjacent pairs of diodes D₁/D₂ . . . D_(n-1) /D_(n), one diode at a time, between open and shortedstates, so as to permit remotely operated ON/OFF diode modulation in anyselected one of multiple adjacent lineal segments of the probe 220. Sucha probe has proved highly effective to measure water content and/ormoisture characteristics of the soil or other medium undergoing analysisat different depths along the probe 220. Such an arrangement alsopermits of ease in measuring the moisture characteristics of the testmedia in two or more adjacent layers of a layered media. Moreover,multi-segment probes embodying features of the present invention canalso be used as depth multiplexers.

In summary, it will be understood by those skilled in the art uponreview of the foregoing Specification in the light of the accompanyingdrawings and the ensuing claims, that there have herein been disclosed anumber of methods, probes and circuit embodiments characterized by theirsimplicity and economy, yet which are highly effective in providingaccurate readings of moisture content and the like in soils and a widerange of other test media utilizing either: i) remotely operable ON/OFFvariable impedance (e.g. diode) modulation; or ii), time delaymodulation. In either case, the arrangement permits of ease ofgeneration and observation of precise, accurate and easily identifiabletiming markers at known positions along the length of the probe despitethe fact that the signal levels usually encountered are small andnormally at least partially obscured by unwanted background noiselevels. The invention may be readily employed with 2-rod, 3-rod and/orother multi-rod conventional probes, or with multi-rod probes which maytake the form of bayonet-type stripline probes embodying features of thepresent invention, all as hereinabove described.

I claim:
 1. A probe for use with Time Domain Reflectometry apparatus ofthe type used to measure the moisture content of a material to be testedand employing an RF cable having first and second conductors forcoupling said probe to the Time Domain Reflectometry apparatus, saidprobe comprising, in combination:a) a non-conductive base portion; b)first conductive means mounted in said base portion and extendinglaterally at right angles with respect thereto; c) second conductivemeans mounted in said base portion and extending laterally at rightangles with respect thereto, said second conductive means being spacedfrom said first conductive means and extending parallel thereto; d) saidfirst and second conductive means defining a multi-conductor probehaving an effective length L; e) means for coupling said firstconductive means to one of the first and second conductors of the RFcable; f) means for coupling said second conductive means to the otherof the first and second conductors of the RF cable; g) means forselectively shorting said first conductive means to said secondconductive means at at least one preselected point along the length L ofsaid probe; h) means for generating a first TDR reflection plot whensaid first and second conductive means are electrically isolated onefrom the other; i) means for generating a second TDR reflection plotwhen said first and second conductive means are shorted one to theother; and, j) means for comparing said first and second TDR reflectionplots to establish at least one precise and unambiguous timing marker tobe used in the measurement of the propagation velocity of a short pulseof energy as it travels along said first and second conductive meanswhen said probe is inserted into the material to be tested.
 2. A probeas set forth in claim 1 wherein said first and second conductive meanscomprise stainless steel rods.
 3. A probe as set forth in claim 1wherein said first conductive means comprises "n" second stainless steelrod(s) wherein "n" is equal to any desired whole integer.
 4. A probe asset forth in claim 1 wherein said probe comprises an elongate, unitary,generally imperforate, probe-like instrument having first and secondspaced, parallel, conductors respectively defining said first and secondconductive means and a central non-conductive dielectric materialseparating said first and second spaced, parallel, conductors.
 5. Aprobe as set forth in claim 1 wherein said means for comparing saidfirst and second TDR reflection plots comprises waveform subtractionmeans.
 6. A probe as set forth in claims 1, 2, 3, 4 or 5 wherein saidmeans for selectively shorting said first conductive means to saidsecond conductive means comprises at lease one variable impedancedevice.
 7. A probe as set forth in claims 1, 2, 3, 4 or 5 wherein saidmeans for selectively shorting said first conductive means to saidsecond conductive means comprises a pair of variable impedance devicesrespectively positioned at two (2) spaced selected points defining theeffective length L of said probe.
 8. A probe as set forth in claim 7wherein the first of said pair of variable impedance devices is mountedon said probe in proximate relation to said non-conductive base portionfor establishing a first selected closed/open circuit adjacent theair/material interface when said probe is inserted into a material to betested and the second of said pair of variable impedance devices ismounted on said probe in proximate relation to the free ends of saidfirst and second conductive means.
 9. A probe as set forth in claims 1,2, 2, 4, or 5 wherein said means for selectively shorting said firstconductive means to said second conductive means includes at east onevariable impedance device and remotely operable switch means forselectively biasing said at least one variable impedance device to oneof a conductive and non-conductive state.
 10. A probe as set forth inclaim 9 wherein said remotely operable switch means comprises one of: i)a manually operated switch means; ii) an electromechanically operatedswitch means; and iii), an electronically operated switch means.
 11. Aprobe as set forth in claims 1, 2, 3, 4 or 5 wherein said means forselectively shorting said first conductive means to said secondconductive means comprises at least one diode.
 12. A probe as set forthin claims 1, 2, 3, 4 or 5 wherein said means for selectively shortingsaid first conductive means to said second conductive means comprises apair of diodes respectively positioned at two (2) spaced selected pointsdefining the effective length L of said probe.
 13. A probe as set forthin claim 12 wherein the first of said pair of diodes is mounted on saidprobe in proximate relation to said non-conductive base portion forestablishing a first selected closed/open circuit adjacent theair/material interface when said probe is inserted into a material to betested and the second of said pair of diodes is mounted on said probe inproximate relation to the free ends of said first and second conductivemeans.
 14. A probe as set forth in claims 1, 2, 3, 4 or 5 wherein saidmeans for selectively shorting said first conductive means to saidsecond conductive means includes at least one diode and remotelyoperable switch means for selectively biasing said at least one diode toone of a conductive and non-conductive state.
 15. A probe as set forthin claim 6 wherein said remotely operable switch means comprises one of:i) a manually operated switch means; ii) an electromechanically operatedswitch means; and iii), an electronically operated switch means.
 16. Aseries averaging probe for use with Time Domain Reflectometry apparatusand characterized by its ability to measure the average moisturecharacteristics of a series of discrete, spaced apart bodies of testmedia, said series averaging probe comprising, in combination:a) "n"sets of discrete rigid RF probe conductor pairs, where "n" is any wholeinteger greater than "1", with the conductors in each pair beingparallel and spaced apart by non-conductive dielectric material; "n"-1sets of flexible RF coupling cables for coupling said "n" sets ondiscrete rigid RF probe conductor pairs together in series; c) a firstremotely operable, normally open, variable impedance device electricallyconnected between said spaced conductors of the first of said "n" pairsadjacent the proximal end thereof; d) a second remotely operable,normally open, variable impedance device electrically coupled betweensaid spaced conductors of the last of said "n" pairs adjacent the distalend thereof; and, e) means for coupling the proximal end of said firstof said "n" pairs of probe conductors to a Time Domain Reflectometryapparatus;whereby, successive ones of said "n" sets of conductor pairscan be passed through adjacent ones of the "n" discrete spaced apartbodies of test media and coupled together by said flexible RF couplingcables in series so that fast rise time energy pulses propagated downsaid series averaging probe by the Time Domain Reflectometry apparatusproduce reflections attributable to discontinuities along the entirelength of said series averaging probe including discontinuities whensaid first and second remotely operable, normally open, variableimpedance devices are shorted, which reflections are returned to theTime Domain Reflectometry apparatus for sampling and processing tothereby produce a measurement representative of the average moisturecharacteristics of the "n" discrete bodies of test media.
 17. A probe asset forth in claim 16 wherein said first and second remotely operable,normally open, variable impedance devices comprise diodes.